Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same

ABSTRACT

Resilient electrical interposers that may be utilized to form a plurality of electrical connections between a first device and a second device, as well as systems that may utilize the resilient electrical interposers and methods of use and/or fabrication thereof. The resilient electrical interposers may include a resilient dielectric body with a plurality of electrical conduits contained therein. The plurality of electrical conduits may be configured to provide a plurality of electrical connections between a first surface of the electrical interposer and/or the resilient dielectric body and a second, opposed, surface of the electrical interposer and/or the resilient dielectric body. The systems and methods disclosed herein may provide for improved vertical compliance, improved contact force control, and/or improved dimensional stability of the resilient electrical interposers.

RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.14/592,749, filed on Jan. 8, 2015, and which is a continuation of U.S.patent application Ser. No. 13/287,794, filed on Nov. 2, 2011, andissued as U.S. Pat. No. 8,970,240 on Mar. 3, 2015, and which claimspriority to U.S. Provisional Patent Application Ser. No. 61/410,242,which was filed on Nov. 4, 2010. The entire disclosures of theabove-identified patent applications are hereby incorporated byreference.

FIELD OF THE DISCLOSURE

The present application is directed to improved resilient electricalinterposers, systems that include the resilient electrical interposers,and methods of utilizing and/or fabricating the resilient electricalinterposers.

BACKGROUND OF THE DISCLOSURE

Electrical interposers are devices that may be utilized to form one ormore electrical connections between a first device and a second device.As used herein, electrical interposers also may be referred to asinterposers, and an electrical connection formed by an interposer may bereferred to as an electrical interface. The interposers may include anyshape that is suitable for forming the electrical interface and may formany suitable number of electrical connections.

Interposers may be utilized in a wide variety of applications where anelectrical interface between the first device and the second device isdesired. As an illustrative, non-exclusive example, the interposer maybe utilized to form a temporary electrical interface between the firstdevice and the second device. As another illustrative, non-exclusiveexample, the interposer may be utilized to form a permanent, or at leastsubstantially permanent, electrical interface between the first deviceand the second device.

The construction, specifications, and/or dimensions of the interposermay vary, such as depending upon the particular application for and/oruse of the interposer. As an illustrative, non-exclusive example, theinterposer may be utilized to form an electrical connection between aprobe head that forms a portion of a test system and a device under test(DUT), such as an integrated circuit device and/or chip. As anotherillustrative, non-exclusive example, the interposer may be utilizedbetween adjacent components, tiers, or other layers of a stacked, or3-D, integrated circuit device and/or chip.

As the dimensions of the individual components that comprise integratedcircuit devices and/or the dimensions of the chip itself continue todecrease, precise control of the dimensional stability of the interposerand/or the contact forces between the interposer and the device undertest become increasingly important. Similarly, as integrated circuitdevices become increasingly complicated, such as through the inclusionof many and/or more complex individual layers of circuitry therein, anability of the interposer to provide for increased height variationamong a plurality of contact pads that may be present on the surface ofthe device under test, which also may be referred to herein as avertical compliance of the interposer, may become increasinglyimportant. Thus, there exists a need for electrical interposers that mayprovide improved vertical compliance, contact force control, and/ordimensional stability.

SUMMARY OF THE DISCLOSURE

Electrical interposers that may be utilized to form a plurality ofelectrical connections between a first device and a second device, aswell as systems that may utilize the electrical interposers and methodsof use and/or fabrication thereof. The electrical interposers mayinclude a resilient dielectric body with a plurality of electricalconduits contained therein. The plurality of electrical conduits may beconfigured to provide a plurality of electrical connections between afirst surface of the electrical interposer and/or the resilientdielectric body and a second, opposed, surface of the electricalinterposer and/or the resilient dielectric body. The interposers,systems, and methods disclosed herein may provide for improved verticalcompliance, improved contact force control, and/or improved dimensionalstability of the electrical interposers, such as compared toconventional interposers and/or interposers having the same orcomparable construction but without the compliance modifying structuredescribed herein.

In some embodiments, the electrical interposer may include a compliancemodifying structure that is configured to change a restoring force thatmay be applied to the plurality of electrical conduits by the resilientdielectric body, such as to change the vertical compliance of theelectrical interposer and/or the contact force between the plurality ofelectrical conduits and the first device and/or the second device. Insome embodiments, the compliance modifying structure may be associatedwith the resilient dielectric body. In some embodiments, the compliancemodifying structure may be associated with the plurality of electricalconduits. In some embodiments, the compliance modifying structure mayinclude a plurality of compliance modifying regions within the resilientdielectric body. In some embodiments, the compliance modifying structuremay include a structure that forms a portion of and/or extends from theplurality of electrical conduits. In some embodiments, the electricalinterposer may include a plurality of expansion pockets and/or adimensional stability layer that is configured to increase thedimensional stability of the resilient electrical interposer whencompressed between the first device and the second device and/or subjectto thermal cycling.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic representation of illustrative, non-exclusiveexamples of a test system that is configured to electrically test adevice under test and that may include an electrical interposeraccording to the present disclosure.

FIG. 2 is a schematic representation of illustrative, non-exclusiveexamples of an electrical interposer according to the presentdisclosure.

FIG. 3 is a top view of a schematic representation of illustrative,non-exclusive examples of an electrical interposer according to thepresent disclosure that includes a plurality of compliance modifyingstructures.

FIG. 4 is a less schematic, but still illustrative, non-exclusiveexample of an electrical interposer according to the present disclosurethat includes a plurality of expansion pockets.

FIG. 5 is another less schematic, but still illustrative, non-exclusiveexample of expansion pockets.

FIG. 6 is a schematic representation of illustrative, non-exclusiveexamples of an electrical interposer according to the present disclosurethat may include a plurality of compliance modifying regions.

FIG. 7 is a less schematic, but still illustrative, non-exclusiveexample of an electrical interposer according to the present disclosurethat includes a plurality of compliance modifying regions.

FIG. 8 is another less schematic, but still illustrative, non-exclusiveexample of an electrical interposer according to the present disclosurethat includes a plurality of compliance modifying regions.

FIG. 9 is a schematic representation of illustrative, non-exclusiveexamples of an electrical interposer according to the present disclosurethat includes a plurality of dielectric layers.

FIG. 10 is a schematic representation of illustrative, non-exclusiveexamples of a layered interposer according to the present disclosure.

FIG. 11 is a schematic representation of illustrative, non-exclusiveexamples of an electrical interposer according to the present disclosurethat may include a plurality of beam contact locating structures, aplurality of probe tip shapes, and/or a plurality of contact structures.

FIG. 12 is a schematic representation of illustrative, non-exclusiveexamples of beam shape variations, beam contact shape variations, and/orelectrical conduit to contact pad conformations according to the presentdisclosure.

FIG. 13 is a schematic representation of illustrative, non-exclusiveexamples of an electrical interposer according to the present disclosurethat may form a portion of a composite space transformer and/or athree-dimensional integrated circuit.

FIG. 14 is a schematic representation of an illustrative, non-exclusiveexample of a socket according to the present disclosure that may beutilized to package and/or test one or more integrated circuit chips.

FIG. 15 is a process flow depicting methods of manufacturing theelectrical interposers according to the present disclosure.

FIG. 16 is a flowchart depicting methods according to the presentdisclosure of improving a dimensional stability of an electricalinterposer by stretching the electrical interposer.

FIG. 17 is a flowchart depicting methods according to the presentdisclosure of increasing a vertical compliance of a device under testcontacting assembly by stacking a plurality of electrical interposers.

DETAILED DESCRIPTION AND BEST MODE OF THE DISCLOSURE

FIG. 1 is a schematic representation of illustrative, non-exclusiveexamples of a test system 1 that is configured to electrically test afirst device 60, such as a device under test 66, and which may includean electrical interposer 10 according to the present disclosure. In theillustrative, non-exclusive example of FIG. 1, electrical interposer 10also may be referred to herein as probe head 10. The test system of FIG.1 includes a probe head assembly 2 that may include a load board 3,which is operatively attached to and/or in electrical communication witha second device 70, such as a space transformer 72. Electricalinterposer 10 may be operatively attached to and/or in electricalcommunication with second device 70. A chuck 4 may hold, retain, and/orotherwise locate first device 60.

The test system further may include and/or be in electricalcommunication with a control system 5 that is configured to control theoperation of test system 1. Control system 5 may be configured tocontrol a relative orientation of probe head assembly 2 with respect tofirst device 60. As an illustrative, non-exclusive example, electricalinterposer 10 may include a plurality of electrical conduits 40 that arein electrical communication with probe head assembly 2 and/or controlsystem 5. Control system 5 may be configured to control the relativeorientation of the probe head assembly with respect to first device 60,such as through the use of control signal 11, to form a plurality ofelectrical connections between the plurality of electrical conduits anda plurality of contact pads 62 that are located on first device 60, suchas on or proximate a surface thereof.

Control system 5 further may include a signal generator 6 that isconfigured to generate, or produce, a test signal 8, which may besupplied through a signal conduit 13 to probe head assembly 2 and/orelectrical conduits 40 before being provided to first device 60. Uponreceipt of test signal 8, first device 60 may produce, or generate,resultant signal 9, which may be provided through electrical conduits40, probe head assembly 2, and/or signal conduit 13 to a signal analyzer7. Signal analyzer 7 may be configured to receive and/or analyze theresultant signal to evaluate one or more electrical characteristics offirst device 60. Illustrative, non-exclusive examples of test systems 1that may include and/or utilize electrical interposers 10 according tothe present disclosure are disclosed in U.S. Provisional PatentApplication Ser. Nos. 61/410,242, 61/446,379, and 61/484,116 and in U.S.Pat. Nos. 5,101,453, 5,914,613, 6,071,009, 6,256,882, 7,190,181,7,368,925, and 7,862,391, the complete disclosures of which are herebyincorporated by reference.

While shown in FIG. 1 in the context of test system 1 and/or probe headassembly 2, electrical interposers 10 according to the presentdisclosure may be utilized in, and/or may form a portion of, anysuitable structure. This may include the use of electrical interposers10 to form a plurality of electrical connections between a first device60 and a second device 70 in a variety of different systems and/orconfigurations. Illustrative, non-exclusive examples of first device 60and/or second device 70 according to the present disclosure may includeany suitable space transformer 72, electronic device, device under test(DUT) 66, integrated circuit, electrical interposer, socket, tier of athree-dimensional integrated circuit, probe head, portion of a probehead, test system, and/or portion of a test system.

As an illustrative, non-exclusive example, electrical interposer 10 mayinclude, form a portion of, and/or be a membrane that is configured toextend across all or a portion of a contact surface of a spacetransformer and to form a plurality of electrical connections betweenthe space transformer and a device under test. As another illustrative,non-exclusive example, electrical interposer 10 may include, form aportion of, and/or be a coupon that is configured to be adhered to aspace transformer and to form a plurality of electrical connectionsbetween the space transformer and a device under test.

As yet another illustrative, non-exclusive example, electricalinterposer 10 may include, form a portion of, and/or be a coupon that isconfigured to form an electrical connection between a first electronicdevice, such as a first tier of a three-dimensional integrated circuit(3-D IC), and a second electronic device, such as a second tier of the3-D IC. As another illustrative, non-exclusive example, electricalinterposer 10 may include, form a portion of, and/or be a coupon that isconfigured to form an electrical connection between a first electronicdevice, such as an integrated circuit, and a socket. As yet anotherillustrative, non-exclusive example, electrical interposer 10 mayinclude, form a portion of, and/or be a coupon that is configured toform an electrical connection between a first space transformer and asecond space transformer.

Electrical interposers 10 may be maintained in electrical communicationwith the first device and/or the second device using any suitablesystem, method, and/or mechanism. As an illustrative, non-exclusiveexample, the coupon may be adhered to the first device and/or the seconddevice. As another illustrative, non-exclusive example, the coupon maybe pressed into electrical communication with at least one of the firstdevice and the second device.

When the coupon is adhered to the first device and/or the second device,any suitable adhesive and/or adhesive configuration may be utilized. Asan illustrative, non-exclusive example, the adhesive may be locatedaround a periphery of the electrical interposer, the first device,and/or the second device such that the adhesive does not contact theplurality of electrical contacts and/or contact pads thereof. As anotherillustrative, non-exclusive example, the adhesive may be patterned suchthat it does not contact the plurality of electrical contacts and/orcontact pads. As another illustrative, non-exclusive example, theadhesive may include a dilute adhesive with a low solids content, suchas less than 1% by weight, and the adhesive may cover an entire surfaceof the electrical interposer but provide for conduction of electriccurrent therethrough.

As discussed in more detail herein, the adhesive, when utilized, may beconfigured to be permanent and/or may be configured to be removed toprovide for separation of electrical interposer 10 from first device 60and/or second device 70 without damage to electrical interposer 10,first device 60, and/or second device 70. In this regard, and when soadhered, it is within the scope of the present disclosure, although notrequired to all embodiments, that a suitable adhesive may be used topermit selective removal of the coupon/interposer without damage to thefirst and second devices, and optionally without damage to thecoupon/interposer and the first and second devices.

Additional illustrative, non-exclusive examples of electricalinterposers 10 according to the present disclosure and/or uses thereofare discussed in more detail herein. Illustrative, non-exclusiveexamples of membranes and/or coupons that may be utilized with thesystems and methods according to the present disclosure are disclosed inU.S. Patent Application Publication No. 2010/0127725 and U.S. Pat. Nos.5,914,613, 7,368,927, and 7,888,957 the complete disclosures of whichare hereby incorporated by reference.

FIG. 2 is a schematic representation of illustrative, non-exclusiveexamples of electrical interposer 10 according to the presentdisclosure. The electrical interposer of FIG. 2 includes a resilientdielectric body 20 that is associated with a plurality of electricalconduits 40. Electrical conduits 40 may be configured to provide aplurality of electrical connections between a first device 60 that isproximal to a first surface 22 of the electrical interposer and a seconddevice 70 that is proximal to a second surface 24 of the electricalinterposer. As used herein, the phrase “associated with” means that agiven structure includes, is proximal to, is in physical communicationwith, is in electrical communication with, surrounds, encapsulates,defines, and/or contains another given structure. As an illustrative,non-exclusive example, and when electrical conduits 40 include metallicelectrical conduits, resilient dielectric body 20 may surround and/orencapsulate at least a portion of each of the metallic electricalconduits.

Electrical interposer 10 may be configured to be compressed betweenfirst device 60 and second device 70 to provide for formation of theplurality of electrical connections, such as to provide for theformation of a plurality of electrical connections between electricalconduits 40 and contact pads 62. When the electrical interposer iscompressed between the first device and the second device, the pluralityof electrical conduits 40 may be configured to deflect from anundeflected configuration to a deflected configuration due to theapplication of a contact force by at least one of the first device andthe second device. When the plurality of electrical conduits is in thedeflected configuration, resilient dielectric body 20 may be deformed bythe deflection and may be configured to provide a restoring force thatmay direct and/or otherwise urge the plurality of electrical conduitsfrom the deflected configuration to the undeflected configuration uponremoval of the contact force.

As shown in FIG. 2, electrical interposer 10 may be associated with oneor more compliance modifying structures 100 that may be configured tocontrol, modify, and/or change a compliance, or deformational responseto externally applied forces, of electrical interposer 10 and/or one ormore components thereof. As illustrative, non-exclusive examples,compliance modifying structures 100 may increase a dimensional stabilityof the electrical interposer when compressed between the first deviceand the second device, may modify (i.e., increase or decrease) amechanical response of the electrical interposer when compressed betweenthe first device and the second device, may increase or decrease therestoring force that is applied to the plurality of electrical conduitsby the resilient dielectric body, may increase or decrease an inducedmotion of the plurality of electrical conduits upon application of agiven contact force magnitude, and/or may increase a relative and/orabsolute magnitude of a distance that electrical interposer 10 may becompressed without damage to the electrical interposer and/or componentsthereof, such as electrical conduits 40 and/or resilient dielectric body20.

As shown in FIG. 2, compliance modifying structures 100 may beassociated with any suitable portion of electrical interposer 10. As anillustrative, non-exclusive example, the compliance modifying structuresmay be associated with resilient dielectric body 20 and may be referredto herein as compliance modifying regions 110 and/or expansion pockets200. Additional illustrative, non-exclusive examples of compliancemodifying regions 110 and/or expansion pockets 200 are discussed in moredetail herein. As another illustrative, non-exclusive example, thecompliance modifying structures may be associated with electricalconduits 40. Illustrative, non-exclusive examples of compliancemodifying structures that are associated with electrical conduits 40 arediscussed in more detail herein.

Resilient dielectric body 20 may include and/or be associated with anysuitable structure and/or materials of construction that are configuredto provide a desired compliance and/or a desired magnitude of therestoring force that may be applied to electrical conduits 40 by theresilient dielectric body. It is within the scope of the presentdisclosure that resilient dielectric body 20 may include and/or be amonolithic dielectric body. Additionally or alternatively, it is alsowithin the scope of the present disclosure that resilient dielectricbody 20 may include and/or be a composite dielectric body.

When resilient dielectric body 20 includes the composite dielectricbody, it is within the scope of the present disclosure that theresilient dielectric body may include any suitable composite structure.As an illustrative, non-exclusive example, and as discussed in moredetail herein, the resilient dielectric body may include a plurality oflayers 26, which also may be referred to herein as resilient layers 26.Illustrative, non-exclusive examples of layers 26 according to thepresent disclosure include any suitable elastomeric layer 28 and/or anysuitable dimensional stability layer 30. As discussed in more detailherein, elastomeric layers 28 may include any suitable layer and/ormaterial that is configured to provide electrical interposer 10 with adesired level of resilience, compliance, and/or elastic deformation uponapplication of an external force thereto. In addition, and as alsodiscussed in more detail herein, dimensional stability layers 30 mayinclude any suitable layer and/or material that is configured to provideelectrical interposer 10 with a desired level of dimensional stability.

Resilient dielectric body 20, and/or one or more layers 26 thereof, mayinclude and/or be constructed from any suitable material and/ormaterials. Illustrative, non-exclusive examples of materials that may beincluded in resilient dielectric body 20 include any suitable polymer,elastomer, silicone, foam, closed cell foam, polyimide, resin, epoxy,urethane, polystyrene, polyethylene, polyamide, ABS, polycarbonate,fluoropolymer, and/or combinations thereof.

Electrical conduits 40 may include any suitable structure that isconfigured to provide the electrical connection between first surface 22and second surface 24 and/or between first device 60 and second device70 associated therewith. As an illustrative, non-exclusive example, andas discussed in more detail herein, electrical conduits 40 may includeone or more probe tips 46 that are configured to form an electricalconnection between electrical conduits 40 and contact pads 62 of firstdevice 60 and/or second device 70. As another illustrative,non-exclusive example, and as also discussed in more detail herein,electrical conduits 40 may include and/or be in electrical communicationwith one or more contact structures 92 that are configured to decreasean abrasion of contact pads 62 when electrical conduits 40 form theelectrical connection therewith.

Electrical conduits 40 additionally or alternatively may include anysuitable structure that is configured to provide for a desired level ofcompliance within electrical interposer 10, and/or compression thereof.As an illustrative, non-exclusive example, contact pads 62 may includeopposed, or at least substantially opposed, contact pads 63, andelectrical conduits 40 may include linear, or at least substantiallylinear, electrical conduits 41.

A longitudinal axis of linear electrical conduits 41 may beperpendicular, or at least substantially perpendicular, to first surface22 and/or second surface 24, as shown in FIG. 2. Additionally oralternatively, the longitudinal axis of linear electrical conduits 41may be at an angle with respect to first surface 22 and/or secondsurface 24.

When the longitudinal axis is perpendicular to first surface 22 and/orsecond surface 24, linear electrical conduits 41 may include electricalconduits that may be configured to bend, flex, compress, and/orotherwise deform to provide for compression of electrical interposer 10.When the longitudinal axis is at an angle with respect to first surface22 and/or second surface 24, the linear electrical conduits may includeflexible electrical conduits, or rigid, or at least substantially rigid,electrical conduits.

As another illustrative, non-exclusive example, contact pads 62 mayinclude offset contact pads 64 and electrical conduits 40 may include anoffset structure that is configured to provide the electrical connectionbetween respective offset contact pads 64 of first device 60 and seconddevice 70. As an illustrative, non-exclusive example, and as discussedin more detail herein, the offset structure may include linearelectrical conduits 41, wherein the longitudinal axis of the linearelectrical conduits extends at an angle to first surface 22 and/orsecond surface 24 and between offset contact pads 64. As anotherillustrative, non-exclusive example, and as also discussed in moredetail herein, the electrical conduits may include rocking beamelectrical conduits 42.

Electrical conduits 40 and/or probe tips 46 thereof may be configured toscrub and/or otherwise abrade a surface oxide film that may be presenton contact pads 62 during compression of electrical interposer 10between first device 60 and second device 70. Illustrative,non-exclusive examples of electrical conduits 40 and/or scrubbing actionthereof that may be utilized with the systems and/or methods accordingto the present disclosure are disclosed in U.S. Provisional PatentApplication Ser. No. 61/410,242, and in U.S. Pat. Nos. 5,914,613,6,256,882, and 7,862,391, the disclosures of which are herebyincorporated by reference.

This scrubbing may decrease a contact resistance and/or increase anelectrical conductivity between electrical conduits 40 and theirrespective contact pads 62. As an illustrative, non-exclusive example,and when contact pads 62 include opposed contact pads 63, a shape ofprobe tip 46 and/or a deformation of electrical conduit 42 duringcompression of electrical interposer 10 may produce a relative motion ofthe probe tip with respect to the opposed contact pads to produce thescrubbing. As another illustrative, non-exclusive example, and whencontact pads 62 include offset contact pads 64, a torque that is placedon electrical conduits 40 during compression of electrical interposer 10may produce the relative motion of probe tip 46 with respect to theoffset contact pads to produce the scrubbing.

Electrical conduits 40 further may include an optional anchor structure52, which also may be referred to herein as a retention structure 52.Anchor structure 52, when present, may be configured to affix, hold,and/or otherwise retain the electrical conduits within electricalinterposer 10 and/or resilient dielectric body 20 thereof. It is withinthe scope of the present disclosure that electrical conduits 40 may beconfigured to be permanently retained within the electrical interposer.However, it is also within the scope of the present disclosure thatelectrical conduits 40 may be configured to be removed from theelectrical interposer without damage to the electrical interposer, theresilient dielectric body, and/or the electrical conduits.

As an illustrative, non-exclusive example, one or more damagedelectrical conduits may be removed from the electrical interposer andreplaced with one or more different electrical conduits that are notdamaged to repair the electrical interposer. As another illustrative,non-exclusive example, one or more electrical conduits may be removedfrom the electrical interposer for repair and/or cleaning before beingreinserted into the electrical interposer. As yet another illustrative,non-exclusive example, one or more electrical conduits that haveseparated from the electrical interposer, such as during use of theelectrical interposer, may be reinserted into the electrical interposer.As a further variant, one or more electrical conduits that have beenlost or separated from the electrical interposer may be replaced withone or more electrical conduits having the same or different sizes orconfigurations.

As discussed in more detail herein, electrical interposers 10 mayinclude any suitable structure and/or be utilized with any suitablemethod that may increase the dimensional stability of the electricalinterposer when it is compressed between first device 60 and seconddevice 70 and/or when the electrical interposer is subjected to thermalcycling. As used herein, the term “dimensional stability” may refer tothe ability of electrical interposers 10 to retain and/or otherwisemaintain a fixed, or at least substantially fixed, orientation ofelectrical conduits 40 with respect to contact pads 62 when theelectrical interposer is compressed between first device 60 and seconddevice 70 and/or when the electrical interposer, together with firstdevice 60 and second device 70, is subjected to thermal cycling. As usedherein, “thermal cycling” refers to repeated heating and cooling such asduring periods of use and non-use.

As an illustrative, non-exclusive example, the systems and methodsdisclosed herein may be configured to decrease a variation in thelocation of electrical conduits 40 when the electrical interposer iscompressed. As another illustrative, non-exclusive example, an increasein the dimensional stability of the electrical interposer may produceand/or be measured by a corresponding decrease in a planar expansion, orexpansion in the plane of first surface 22 and/or second surface 24,when the electrical interposer is compressed. As yet anotherillustrative, non-exclusive example, increased dimensional stability mayprovide for maintaining the plurality of electrical connections betweenelectrical conduits 40 and the associated contact pads 62 of firstdevice 60 and/or second device 70 over a desired range of temperaturesdespite differences in a coefficient of thermal expansion amongelectrical interposer 10, first device 60, and/or second device 70.

Illustrative, non-exclusive examples of structures that may be utilizedto increase the dimensional stability of electrical interposer 10include dimensional stability layers 30 and/or expansion pockets 200 andare discussed in more detail herein. As shown in dashed lines in FIG. 2,expansion pockets 200 may be contained within resilient dielectric body20. However, and as shown in dash-dot lines in FIG. 2, expansion pockets200 also may extend from and/or between first surface 22 and secondsurface 24.

Illustrative, non-exclusive examples of methods that may increase thedimensional stability of the electrical interposer are discussed in moredetail herein and may include thermal cycling of the interposer and/orstretching the electrical interposer from a first, or undeformed, sizeto a second, or deformed, size that is larger than the first size in theplane of first surface 22 and/or second surface 24 prior to compressionof the electrical interposer between first device 60 and second device70. Stretching the electrical interposer also may provide for a smallerdifference in an effective coefficient of thermal expansion between thematerials that comprise electrical interposer 10 and the materials thatcomprise first device 60 and/or second device 70 due to the internalstresses that may be produced within electrical interposer 10 by thestretching.

When electrical interposer 10 is not providing the plurality ofelectrical connections between first device 60 and second device 70,first device 60 and/or second device 70 may include and/or be a cover65, which also may be referred to herein as a handler 65, that may beconfigured to cover, encase, and/or otherwise protect electricalinterposer 10, electrical conduits 40, and/or probe tips 46 thereof fromdamage. Cover 65 may include a plurality of recesses that may be locatedto correspond to a location of the plurality of electrical conduits andmay accept probe tips 46 of electrical conduits 40.

FIGS. 3-14 provide additional, less schematic but still illustrative,non-exclusive examples of electrical interposers 10 according to thepresent disclosure and/or systems, components, features, structures,and/or configurations that may be included in and/or utilized withelectrical interposers 10 according to the present disclosure. Similarstructures, including those of FIGS. 1-2, are denoted with similarnumbers and may not be discussed in detail herein with reference to eachindividual Figure. It is within the scope of the present disclosure thatany of the systems, components, features, structures, and/orconfigurations disclosed herein may be utilized with any electricalinterposer 10 according to the present disclosure. In addition, althoughseveral of the Figures illustrate electrical conduits 40 as includinglinear electrical conduits 41 and rocking beam electrical conduits 42,any suitable electrical conduit 40 and/or any suitable combinationthereof may be utilized in any electrical interposer 10 according to thepresent disclosure. As an illustrative, non-exclusive example,electrical interposer 10 may include rocking beam electrical conduit 42but not linear electrical conduit 41.

FIG. 3 provides a top view of a schematic representation ofillustrative, non-exclusive examples of an electrical interposer 10according to the present disclosure that includes a plurality ofcompliance modifying structures 100 in the form of a plurality ofcompliance modifying regions 110 and/or expansion pockets 200 that arepresent in and/or associated with resilient dielectric body 20. As shownin FIG. 3, compliance modifying regions 110 may be associated with, bein mechanical communication with, separate at least a portion ofresilient dielectric body 20 from, and/or be adjacent to electricalconduits 40. This may include compliance modifying regions 110 that maybe directly adjacent to and/or touching electrical conduits 40, as wellas compliance modifying regions that may be spaced apart from electricalconduits 40.

Additionally or alternatively, compliance modifying regions 110 may beassociated with, proximal to, and/or in mechanical communication withany suitable portion of electrical conduits 40. As an illustrative,non-exclusive example, electrical conduits 40 may include rocking beamelectrical conduits 42 that may include a beam structure 44, a probe tip46, and a beam contact 48, and compliance modifying regions 110 may beassociated with the beam structure, the probe tip, and/or the beamcontact.

As also shown in FIG. 3, expansion pockets 200 may be present at anysuitable location within electrical interposer 10. As an illustrative,non-exclusive example, electrical interposer 10 may include one or moreexpansion pockets 200 between and/or separating adjacent electricalconduits 40. As another illustrative, non-exclusive example, electricalinterposer 10 may include one or more expansion pockets 200 that areseparated from, isolated from, and/or not located between electricalconduits 40.

As illustrated schematically in FIG. 3, compliance modifying structures100, compliance modifying regions 110, and/or expansion pockets 200, mayinclude any suitable shape, length, cross-sectional shape, orientation,and/or extent within electrical interposer 10. As illustrative,non-exclusive examples, compliance modifying regions 110 and/orexpansion pockets 200 may include circular, arcuate, ellipsoidal,elongate, and/or rectilinear cross-sectional shapes. As additionalillustrative, non-exclusive examples, compliance modifying regions 110and/or expansion pockets 200 may be contained between the first surfaceand the second surface of the electrical interposer, may extend from atleast one of the first surface and the second surface, and/or may extendbetween the first surface and the second surface (as shown in FIG. 2).

As also shown in FIG. 3, compliance modifying regions 110 and/orexpansion pockets 200 may not be uniformly distributed within resilientdielectric body 20. As illustrative, non-exclusive examples, this mayinclude compliance modifying regions and/or expansion pockets that arenot uniformly distributed in a direction that is parallel to at leastone of the first surface and the second surface of the resilientdielectric body and/or are systematically distributed within theresilient dielectric body. However, compliance modifying regions 110and/or expansion pockets 200 may include and/or be randomly and/orregularly distributed regions and/or domains within the resilientdielectric body.

Compliance modifying structures, including compliance modifying regions110 and/or expansion pockets 200 thereof, may include any suitablematerials of construction that may be configured to modify the restoringforce that is applied to electrical conduits 40 by resilient dielectricbody 20 and/or to increase the dimensional stability of electricalinterposer 10, respectively. As an illustrative, non-exclusive example,the compliance modifying structures may include a different composition,a different chemical composition, a different density, a differentviscoelasticity, a different Young's modulus, and/or a different yieldstrain than that of the resilient dielectric body. Illustrative,non-exclusive examples of compliance modifying regions 110 and/orexpansion pockets 200 include any suitable void within resilientdielectric body 20, air pocket within the resilient dielectric body,domain with a different composition than that of the resilientdielectric body, and/or foam domain within the resilient dielectricbody.

FIGS. 4-5 provide less schematic but still illustrative, non-exclusiveexamples of an electrical interposer 10 according to the presentdisclosure that includes a plurality of expansion pockets 200. As shownin FIGS. 4 and 5, expansion pockets 200 may be located between aplurality of electrical conduits 40, with the plurality of electricalconduits being configured to provide the electrical connection betweencontact pads 62 that are associated with first device 60 and contactpads 62 that are associated with second device 70.

In FIG. 4, first device 60 and second device 70 are in contact with, butare not compressing, electrical interposer 10, and expansion pockets 200are in an expanded configuration 202. In contrast, FIG. 5 shows firstdevice 60 and second device 70 compressing electrical interposer 10,with expansion pockets 200 in a contracted, or compressed, configuration204.

As shown in FIG. 5, expansion pockets 200 are configured to provide forcompression of the electrical interposer in a region between theelectrical contacts without substantial motion of the plurality ofelectrical contacts with respect to the contact pads associated withfirst device 60 and/or second device 70 and/or a substantial change inan overall dimension and/or area of electrical interposer 10 in a planeof first surface 22 and/or second surface 24. Additionally oralternatively, expansion pockets 200 also may change, modify, increase,and/or decrease a mechanical coupling between and/or among adjacentand/or proximal electrical conduits 40, such as by modifying theviscoelastic behavior of the portion of the resilient dielectric bodythat extends therebetween.

FIG. 6 provides a schematic representation of illustrative,non-exclusive examples of an electrical interposer 10 according to thepresent disclosure that includes a plurality of compliance modifyingregions 110. As discussed in more detail herein and as shown in FIG. 6,electrical conduits 40 of electrical interposer 10 may include anysuitable shape and/or structure, including rocking beam electricalconduits 42.

Rocking beam electrical conduit 42 may include a plurality ofstructures, including beam structure 44, probe tip 46, and/or beamcontact 48. Probe tip 46 may extend from beam structure 44 in a firstdirection and may extend past first surface 22. In addition, beamcontact 48 may extend from beam structure 44 in a second direction thatis generally opposed to the first direction and may extend at leastflush with second surface 24. Beam structure 44 may be in mechanicalcontact with, adhered to, and/or operatively attached to resilientdielectric membrane 20 and may be parallel to, or at least substantiallyparallel to, first surface 22 and/or second surface 24 when theelectrical interposer, and/or the resilient dielectric body thereof, isin the undeformed state (i.e., not compressed between first device 60and second device 70), as shown in solid lines in FIG. 6.

It is within the scope of the present disclosure that rocking beamelectrical conduit 42 may include any suitable material properties,composition, and/or materials of construction. As illustrative,non-exclusive examples, rocking beam electrical conduit 42 and/or beamstructure 44, probe tip 46, and/or beam contact 48 thereof, may includeand/or be a rigid structure, a substantially rigid structure, a flexiblestructure, a monolithic structure, and/or a composite structure.

As discussed in more detail herein, electrical interposer 10 may beconfigured to be compressed between first device 60 and second device70. When the electrical interposer is compressed, first device 60 and/orsecond device 70 may apply a contact force to the electrical interposer,such as to resilient dielectric body 20, probe tips 46, and/or beamcontacts 48 thereof. This contact force may rotate, deflect, and/orotherwise disturb an orientation of resilient dielectric body 20 and/orrocking beam electrical conduit 42, such as shown in dash-dot-dot linesin FIG. 6, and the electrical interposer may apply an equal and oppositerestoring force to first device 60 and second device 70, such as throughresilient dielectric body 20, probe tips 46, and/or beam contacts 48thereof.

Compliance modifying regions 110 may be associated with, proximal to,and/or in mechanical communication with any suitable portion of therocking beam electrical conduit, including beam structure 44, as shownschematically at 114, probe tip 46, as shown schematically at 116,and/or beam contact 48, as shown schematically at 118. When a compliancemodifying region is associated with beam structure 44 and/or probe tip46, the compliance modifying region 110 may be configured to change,decrease, or increase the restoring force that may be applied to therocking beam electrical conduit when the rocking beam electrical conduitis deflected due to the application of the contact force thereto.

As an illustrative, non-exclusive example, a compliance modifying regionthat is associated with the beam structure and/or the probe tip mayinclude a void, an air pocket, and/or another region and/or materialwith a lower (or nonexistent) Young's modulus than that of resilientdielectric body 20. This may decrease the restoring force that may beapplied to the rocking beam electrical conduit by the resilientdielectric body for a given amount of compression of the electricalinterposer and/or deflection of the rocking beam electrical conduit,thereby decreasing a contact force between the rocking beam electricalconduit and first device 60 and/or second device 70. Additionally oralternatively, this may increase a distance that the rocking beamelectrical conduit may be deflected without damage to electricalinterposer 10, thereby increasing the compliance of the electricalinterposer.

As another illustrative, non-exclusive example, the compliance modifyingregion that is associated with the beam structure and/or the probe tipmay include a region and/or material with a higher Young's modulus thanthat of resilient dielectric body 20. This may increase the restoringforce that may be applied to the rocking beam electrical conduit by theresilient dielectric material for a given amount of compression of theelectrical interposer and/or deflection of the rocking beam electricalconduit, thereby increasing a contact force between the rocking beamelectrical conduit and first device 60 and/or second device 70.

When the compliance modifying region 110 is associated with beam contact48, the compliance modifying region may be configured to change,decrease, or increase the restoring force that may be applied to therocking beam electrical conduit, as described above. Additionally oralternatively, the compliance modifying region also may be configured tochange, decrease, or increase the scrubbing action between probe tip 46and first device 60 upon compression of electrical interposer 10 betweenthe first device and the second device.

As an illustrative, non-exclusive example, and as shown at 118, acompliance modifying region that is associated with the beam contact mayinclude a void, an air pocket, and/or another region and/or materialwith a lower (or nonexistent) Young's modulus than that of resilientdielectric body 20. This may increase a degree of freedom and/or arelative motion of beam contact 48 upon compression of the electricalinterposer (as shown at 120) when compared to a rocking beam electricalinterposer that does not include compliance modifying region 118 (asshown at 122). This increase in the relative motion of beam contact 48may provide for scrubbing between beam contact 48 and second device 70and/or may provide for a decrease in the relative motion, or scrubbing,between probe tip 46 and first device 60 (as shown at 124) when comparedto a rocking beam electrical interposer that does not include compliancemodifying region 118 (as shown at 126).

FIGS. 7-8 provide less schematic, but still illustrative, non-exclusive,examples of an electrical interposer 10 according to the presentdisclosure that includes a plurality of compliance modifying regions 110and a plurality of rocking beam electrical conduits 42. FIG. 7illustrates the electrical interposer in the undeformed state, whileFIG. 8 illustrates the electrical interposer in the deformed state afterbeing compressed between first device 60 and second device 70. As shownat 21 in FIG. 8, the presence of compliance modifying regions 110 withinresilient dielectric body 20 may provide deformation modes for resilientdielectric body 20 and/or ranges of motion for rocking beam electricalcontact 42 that may not be available to an electrical interposer thatincludes resilient dielectric body 20 and rocking beam electricalconduits 42 but that does not include compliance modifying regions 110.

FIG. 9 provides a schematic representation of illustrative,non-exclusive examples of an electrical interposer 10 according to thepresent disclosure that includes a plurality of planar dielectric layers26. Planar dielectric layers 26 may include and/or be any suitablematerial and serve any suitable purpose. As an illustrative,non-exclusive example, the planar dielectric layers may include and/orbe one or more elastomeric layers 28 that are configured to provideincreased elasticity and/or compliance to the electrical interposer. Anillustrative, non-exclusive example of an elastomeric layer includes asilicone layer.

As another illustrative, non-exclusive example, the planar dielectriclayers may include and/or be one or more dimensional stability layers 30that are configured to increase the dimensional stability of theelectrical interposer and/or maintain an at least substantially fixedrelative orientation of the plurality of electrical conduits 40 within aplane of the resilient dielectric body when electrical interposer 10 iscompressed and/or experiences thermal cycling. An illustrative,non-exclusive example of a dimensional stability layer includes apolyimide layer.

The dimensional stability layer may be present at any suitable locationwithin electrical interposer 10 and/or resilient dielectric body 20thereof. As illustrative, non-exclusive examples, dimensional stabilitylayer 30 may be present on and/or form first surface 22 of the resilientdielectric body and/or second surface 24 of the resilient dielectricbody. As another illustrative, non-exclusive example, the dimensionalstability layer may be present between two or more other layers of theresilient dielectric body.

When the dimensional stability layer is present on first surface 22 ofthe resilient dielectric body, the dimensional stability layer may coverand/or encapsulate at least a portion of beam structure 44 of rockingbeam electrical conduit 42, while probe tip 46 of the rocking beamelectrical conduit may extend through the dimensional stability layer,which may serve to anchor, or retain, the rocking beam electricalconduit within the electrical interposer. It is within the scope of thepresent disclosure that layers 26 may be operatively attached and/oraffixed to one other, such as by adhesion. However, it is also withinthe scope of the present disclosure that layers 26 may be proximal toand/or in mechanical contact with one another but not adhered, orotherwise affixed, to one another.

FIG. 10 provides a schematic representation of illustrative,non-exclusive examples of an interposer 10 according to the presentdisclosure in the form of a layered interposer 12. Layered interposers12 may include two or more interposer layers 14.

In FIG. 10, layered interposer 12 includes first interposer layer 16 andsecond interposer layer 18 that is aligned therewith. A gap 94 separatesresilient dielectric body 20 of first interposer layer 16 from resilientdielectric body 20 of second interposer layer 18. Electrical conduits 40of first interposer layer 16 are aligned with respective electricalconduits 40 of second interposer layer 18 to provide for the formationof a composite electrical conduit between first surface 32 and secondsurface 34 of the layered interposer.

Interposer layers 14 may be arranged such that first surface 22 of firstinterposer layer 16 forms first surface 32 of the layered electricalinterposer, while second surface 24 of first interposer layer 16 isproximal to and/or in electrical communication with first surface 22 ofsecond interposer layer 18. In addition, second surface 24 of secondinterposer layer 18 forms second surface 34 of the layered electricalinterposer.

FIG. 10 illustrates two interposer layers 14. However, it is within thescope of the present disclosure that layered interposer 12 may includeany suitable number of interposer layers 14, including 3, 4, 5, 6, 7, ormore than 7 interposer layers 14, such as through the inclusion of oneor more intermediate interposer layers between first interposer layer 16and second interposer layer 18.

Interposer layers 14 may include any suitable interposer and/orinterposer structures, including the illustrative, non-exclusiveexamples of interposers 10 and/or interposer structures that arediscussed in more detail herein. It is within the scope of the presentdisclosure that each interposer layer 14 of layered interposer 12 may besimilar to, be a mirror image of, and/or include similar structuresand/or materials of construction as the other interposer layers of thelayered interposer. However, it is also within the scope of the presentdisclosure that at least one interposer layer 14 of layered interposer12 may include different structures and/or materials of constructionthan at least one other interposer layer 14.

Gap 94 may include any suitable structure that is configured to providefor deformation of at least a portion of first interposer layer 16, suchas resilient dielectric body 20 thereof, without deformation of acorresponding portion of second interposer layer 18, such as resilientdielectric layer 20 thereof. As an illustrative, non-exclusive example,gap 94 may include an air gap. As another illustrative, non-exclusiveexample, gap 94 may include a filled gap that includes a dielectricmaterial that is configured to be compressed between first interposerlayer 16 and second interposer layer 18, an illustrative, non-exclusiveexample of which includes a dielectric foam.

As discussed in more detail herein, layered interposer 12 is configuredto be compressed between first device 60 and second device 70 and toform a plurality of electrical connections therebetween. It is withinthe scope of the present disclosure that layered electrical interposer12 may provide increased compliance, or compression, without damage tothe layered interposer 12, first device 60, and/or second device 70 whencompared to an interposer that is substantially similar to individualinterposer layers 14 of the layered interposer 12 but that does notinclude the plurality of interposer layers. As illustrative,non-exclusive examples, layered interposer 12 may be configured to becompressed a compression distance of at least 10, at least 20, at least30, at least 40, at least 50, at least 60, at least 70, at least 80, atleast 90, at least 100, at least 125, at least 150, at least 200, or atleast 250 micrometers.

FIG. 11 provides a schematic representation of illustrative,non-exclusive examples of an electrical interposer 10 according to thepresent disclosure that may include a plurality of probe tip shapesand/or may include and/or be in mechanical and/or electricalcommunication with a plurality of beam contact locating structures 97and/or a plurality of contact structures 92. As discussed in more detailherein, rocking beam electrical conduits 42 may be configured to providea scrubbing action between probe tip 46 thereof and contact pad 62 offirst device 60.

However, first device 60 may not be configured to provide for thescrubbing action, such as when contact pad 62 includes a thin contactpad and/or a contact pad that may be formed from a soft material.Additionally or alternatively, contact pad 62 and/or probe tip 46 maycomprise a noble material and the oxide film may not form thereon. Thus,electrical interposers 10 also may include and/or be in mechanicaland/or electrical communication with a plurality of contact structures92 that may be configured to decrease a mechanical wear and/or abrasionof contact pads 62 due to the formation of the electrical communicationwith electrical interposer 10.

As an illustrative, non-exclusive example, and as shown in FIG. 11,contact structure 92 may be present between probe tip 46 and contact pad62. When the contact structure is present between probe tip 46 andcontact pad 62, the scrubbing action of probe tip 46 may be performed oncontact structure 92. Thus, contact pad 62 may be moved into electricalcommunication with contact structure 92 without, or without substantial,relative motion, wear, and/or abrasion therebetween.

It is within the scope of the present disclosure that contact structure92 may be associated with a resilient dielectric body 20 that may beseparate from and/or form a portion of electrical interposer 10. It isalso within the scope of the present disclosure that contact structure92 may include one or more anchor structures 52 that are configured toretain the contact structure within the resilient dielectric membrane.

Illustrative, non-exclusive examples of anchor structures 52 accordingto the present disclosure include any suitable structure that may serveto retain the contact structure within the resilient dielectricmembrane, an illustrative, non-exclusive example of which includes firstand second opposed elliptical cross-sections, wherein a top portion 102of the cross-section of contact structure 92 that is shown in FIG. 11 istaken along a narrow axis of the first opposed elliptical cross-section,while a bottom portion 104 of the cross-section of contact structure 92that is shown in FIG. 11 is taken along a wide axis of the secondopposed elliptical cross section. Other opposed geometric configurationsmay be used in addition to, or in place of, the illustrative,non-exclusive example of elliptical shapes.

As shown in FIG. 11, second device 70 may include one or more beamcontact locating structures 97, which also may be referred to herein aslocating structures 97, that are configured to index, fix, register,align, restrain and/or locate beam contacts 48 with respect to acorresponding location on second device 70. Illustrative, non-exclusiveexamples of locating structures 97 according to the present disclosureinclude any suitable post 98 and/or detent 99 that is configured toaccept and/or mechanically interact with beam contact 48.

As also shown in FIG. 11, probe tips 46 according to the presentdisclosure may include any suitable shape and/or profile. Asillustrative, non-exclusive examples, probe tips 46 may include bluntprofiles 54, arcuate profiles 56, and/or sharp profiles. Illustrative,non-exclusive examples of arcuate probe tip shapes according to thepresent disclosure include any suitable rounded, hemispherical, and/orinverse convolute profile and/or shape.

Blunt profiles 54 and/or arcuate profiles 56 may decrease wear and/orabrasion of contact pads 62 when probe tips 46 form the electricalconnection therewith. However, the blunt and/or arcuate profiles alsomay decrease the scrubbing action, thereby increasing a potential forhigh contact resistances between the probe tips and the contact pads. Incontrast, sharp probe tips may increase the wear and/or abrasion of thecontact pads. However, this increased wear and/or abrasion may not bedesired in all systems, such as in systems that provide for the repeatedformation of electrical contact between the probe tips and the contactpads.

It is within the scope of the present disclosure that probe tips 46 andcontact pads 62 may include any suitable relative size. As anillustrative, non-exclusive example, and as shown in FIG. 11, the probetips may be significantly smaller than the contact pads. As anotherillustrative, non-exclusive example, a characteristic dimension of theprobe tip may be larger than a characteristic dimension of the contactpad with which it is configured to form the electrical connection.Illustrative, non-exclusive examples of characteristic dimensions ofprobe tips 46 according to the present disclosure include any suitablediameter of the probe tip, effective diameter of the probe tip, radiusof the probe tip, and/or effective radius of the probe tip.Illustrative, non-exclusive examples of characteristic dimensions ofcontact pads 62 according to the present disclosure include any suitablelength, width, diameter, and/or radius of the contact pad.

FIG. 12 is a top view of an electrical interposer 10 according to thepresent disclosure and provides a schematic representation ofillustrative, non-exclusive examples of beam shape variations, beamcontact shape variations, and/or electrical conduit to contact padconformation variations. FIG. 12 illustrates that any suitable number ofelectrical conduits 40 and/or probe tips 46 may be utilized to form theelectrical connection with a given contact pad 62. As an illustrative,non-exclusive example, and as shown at 130, a single electrical conduit40 may form the electrical connection with a given contact pad. Asanother illustrative, non-exclusive example, and as shown at 132, aplurality of electrical conduits 40 may form the electrical connectionwith a given contact pad. It is within the scope of the presentdisclosure that any suitable number of electrical conduits may form theelectrical connection with a given contact pad, including 2, 3, 4, 5,10, 2-5, 2-10, or more than 10 electrical conduits.

FIG. 12 further illustrates that electrical conduits 40 and/or beamstructures 44 thereof may include any suitable shape and/or conformationand/or may include one or more compliance modifying structures 100 thatare associated with rocking beam electrical conduit 42. As illustrative,non-exclusive examples, and as shown by the plurality of beamconformations that are illustrated in FIG. 12 and indicated at 105, alength and/or width of beam 44 may vary in order to provide for adesired compliance. As another illustrative, non-exclusive example, andas shown at 106, beam 44 may include a non-rectangular cross-sectionalshape. As another illustrative, non-exclusive example, beam 44 mayinclude a beam extension 61, such as a rectangular and/or triangularbeam extension 61, that may be configured to increase an interactionbetween electrical conduit 40 and resilient dielectric body 20. As yetanother illustrative, non-exclusive example, beam 44 may include a beamcontact 48 with a non-circular cross-sectional shape that is configuredto increase a distance between a central axis of probe tip 46 and acentral axis of beam contact 48 for a given length of beam 44.

The above variations in the conformation of electrical conduits 40 mayprovide for variation in the restoring force that is applied toelectrical conduits 40 by resilient dielectric body 20, and/or thecontact force that is applied to contact pad 62 by tip 46. In addition,the above variations in beam shape and/or conformation also may beutilized to increase a density of electrical contacts with a givenspacing, pitch, or density, within electrical interposer 10 whilemaintaining a desired restoring force and/or contact force by tailoringa shape of a given electrical conduit to the space that may be availabletherefor.

FIGS. 13-14 provide illustrative, non-exclusive examples of systems thatmay include and/or utilize electrical interposers 10 according to thepresent disclosure. FIG. 13 provides a schematic representation ofillustrative, non-exclusive examples of an electrical interposer 10according to the present disclosure that may form a portion of acomposite space transformer 140 and/or a three-dimensional integratedcircuit (3-D IC) 160. In FIG. 13, electrical interposer 10, whichincludes a plurality of electrical conduits 40, is operatively attachedto, and forms a plurality of, electrical connections between firstdevice 60 and second device 70.

The electrical interposer may be operatively attached to first device 60and/or second device 70 in any suitable manner. As an illustrative,non-exclusive example, the electrical interposer may be adhered to oneand/or both of first device 60 and second device 70. As anotherillustrative, non-exclusive example, the electrical interposer may bemechanically pressed into electrical communication with one and/or bothof first device 60 and second device 70. It is within the scope of thepresent disclosure that electrical interposer 10 may be permanentlyattached to the first device and/or the second device; however, it isalso within the scope of the present disclosure that the electricalinterposer may be configured to be separated from first device 60 and/orsecond device 70 without damage to the electrical interposer, firstdevice 60, and/or second device 70.

As an illustrative, non-exclusive example, electrical interposer 10 maybe configured to be dissolved from between first device 60 and seconddevice 70. As another illustrative, non-exclusive example, the pluralityof electrical connections may be maintained by mechanically pressing thefirst device and the second device together and the devices may beseparated by ceasing the mechanical pressing. As another illustrative,non-exclusive example, the devices may be disassembled to rework and/orreplace first device 60, second device 70, and/or interconnect structure10.

Composite space transformer 140 may be configured to provide a pluralityof electrical connections between a first electrical device thatincludes a plurality of electrical contact pads that are spaced at afirst pitch 82 and a second electrical device that includes a pluralityof contact pads that are spaced at a second pitch 86 that is less thanthe first pitch. If the first pitch is significantly larger than thesecond pitch, it may be difficult to construct a single spacetransformer that may accommodate the large pitch change, and/orcomposite space transformer 140 may be more cost effective and/or moreefficient than a single space transformer.

When FIG. 13 represents composite space transformer 140, first device 60may include a first space transformer 142. First space transformer 142may include a first surface 146 that includes the plurality ofelectrical contacts 62 that are spaced at first pitch 82 and a secondsurface 148 that includes a first plurality of electrical contacts 62that are spaced at an intermediate pitch 84 that is between the firstpitch and the second pitch. As an illustrative, non-exclusive example,first space transformer 142 may be constructed using conventional spacetransformer construction techniques.

Furthermore, second device 70 may include a second space transformer144. Second space transformer 144 may include a first surface 146 thatincludes a second plurality of electrical contacts 62 that are spaced atintermediate pitch 84, and a second surface 148 that includes theplurality of electrical contacts 62 that are spaced at second pitch 86.As an illustrative, non-exclusive example, second space transformer 144may be constructed on a semiconductor wafer and/or using semiconductormanufacturing techniques to provide for the relatively smaller spacingof second pitch 86.

Electrical interposer 10 may form the plurality of electricalconnections between second surface 148 of first space transformer 142and first surface 146 of second space transformer 144. As shown indashed lines in FIG. 13, composite space transformer 140 further mayinclude one or more additional electrical interposers 10 that may beconfigured to provide an electrical connection between the compositespace transformer and another device.

3-D IC 160 of FIG. 13 may include a plurality of discrete integratedcircuit devices (IC devices), which also may be referred to herein astiers and/or layers of the 3D IC. When FIG. 13 represents 3-D IC 160,first device 60 may include a first IC device 162 and second device 70may include a second IC device 164, each of which may include aplurality of contact pads 62 that are configured to transfer a pluralityof electric currents between the first IC device and the second ICdevice. Interposer 10, which as discussed also may be referred to hereinas interconnect structure 10, may form a plurality of electricalconnections between the plurality of contact pads associated with firstIC device 162 and the plurality of respective contact pads associatedwith second IC device 164 to transfer the plurality of electric currentstherebetween.

Although 3-D IC 160 of FIG. 13 is illustrated as including two ICdevices, it is within the scope of the present disclosure that 3-D IC160 may include any suitable number of IC devices, including 3, 4, 5, 6,7, 8, 9, 10, or more than 10 IC devices. As an illustrative,non-exclusive example, and as shown in dashed lines in FIG. 13, the 3-DIC may include a second interconnect structure 10 and a third IC devicemay be attached thereto. Additionally or alternatively, the secondinterconnect structure may be utilized to form a plurality of electricalconnections between the 3-D IC and another device, illustrative,non-exclusive examples of which include a printed circuit board and/or asocket that is configured to mount the 3-D IC within an electronicdevice and/or system.

FIG. 14 provides a schematic representation of an illustrative,non-exclusive example of a second device 70, such as a socket 180,according to the present disclosure that may be utilized to packageand/or test one or more first devices 60, such as one or more IC devices182. Socket 180 may form a portion of test system 1 and/or probe headassembly 2 (shown in FIG. 1). Additionally or alternatively, socket 180may be utilized during the packaging and/or assembly of IC devices 182.

In FIG. 14, electrical interposer 10, which also may be referred toherein as interconnect structure 10, may provide a plurality ofelectrical connections between socket 180 and integrated circuit device182. As discussed in more detail herein, socket 180 may be maintained inelectrical communication with IC device 182 using any suitable systemand/or method, illustrative, non-exclusive examples of which includeadhesive bonding and/or mechanical pressing.

When socket 180 is utilized during packaging and/or assembly of ICdevice 182, the socket may be configured to be in permanent, or at leastsubstantially permanent, electrical communication with the IC device.However, it is within the scope of the present disclosure that thesocket may be configured to be separated from the IC device, such as torework, repair, and/or replace the socket and/or the IC device, and thatthe illustrative, non-exclusive examples of attachment and detachmentstructures and method described herein may be utilized to do so.

When socket 180 is utilized during testing of IC device 182,interconnect structure 10 may be permanently, or at least substantiallypermanently, attached to socket 180 and may be brought into temporaryelectrical connection with a device under test 66, such as one or moreIC devices 182. As shown in FIG. 14, socket 180 may initially be broughtinto electrical connection with a first IC device 162 and maysubsequently be brought into electrical communication with one or moresubsequent IC devices 166. While socket 180 is in electricalcommunication with the IC devices, test system 1 and/or probe headassembly 2 (shown in FIG. 1) may provide a plurality of test signals tothe IC devices and/or receive a plurality of resultant signals from theIC devices to test the operation thereof.

Socket 180 may include an interposer structure that is configured totransfer the plurality of electric currents between the IC devices andtest system 1 and/or probe head assembly 2 (shown in FIG. 1).Additionally or alternatively, socket 180 also may include and/or be anIC device 182. As an illustrative, non-exclusive example, IC devices 182may form a portion of a 3-D IC, with socket 180 representing a firsttier of the 3-D IC and first and/or subsequent IC devices 162 and/or 166representing a second tier of the 3-D IC that is configured to operatein conjunction with the first tier. Under these conditions, socket 180may include active and/or passive electronic components, such as logicand/or memory circuitry that may interact with complementary electroniccomponents that may be present in first and/or subsequent IC devices 162and/or 166.

FIG. 15 is a process flow depicting illustrative, non-exclusive examplesof methods of manufacturing an electrical interposer 10 according to thepresent disclosure. The process flow of FIG. 15 may include theformation of a plurality of first openings 304 on a substrate 302 at300. At 305, a first layer of photoresist 307 may be applied to thesubstrate and patterned to produce a plurality of second openings 312,as shown at 310. At 315, first openings 304 and second openings 312 maybe filled with a first conductive material 317 to form a first portionof a rocking beam electrical conduit 42, such as beam structure 44 andprobe tip 46 thereof. At 320, first conductive material 317 may bepolished to a desired thickness and/or planarity, and a second layer ofphotoresist 322 may be applied to the substrate and patterned to producea third opening 324. At 325, the second opening may be filled with asecond conductive material 327 to define beam contact 48 and/or aportion thereof, while at 330, second conductive material 327 may bepolished to produce a desired length for beam contact 48. At 335, firstlayer of photoresist 307 and second layer of photoresist 322 are removedto produce a rocking beam electrical conduit 42 that is attached tosubstrate 302. At 340, an adhesive layer 342 optionally may be appliedto substrate 302 and/or rocking beam electrical conduit 42.

At 345, an elastomeric layer 347 optionally may be formed on a carriersurface 348 and pressed into contact with substrate 302 and rocking beamelectrical conduit 42, as shown at 350. Alternatively, and as shown at349, elastomeric layer 347 may be formed on and/or applied to substrate302, and carrier surface 348 may be pressed into contact with theelastomeric layer, as shown at 350. At 355, substrate 302 and carriersurface 348 may be removed to produce electrical interposer 10.

Substrate 302 may include any suitable material, illustrative,non-exclusive examples of which include a crystalline material, asemiconductor material, a silicon material, a glass material, a metallicmaterial, copper, and/or a material with a low coefficient of thermalexpansion. First openings 304 may be formed in substrate 302 using anysuitable process. As an illustrative, non-exclusive example, the firstopening may be etched into the substrate. As another illustrative,non-exclusive example, the first opening may be formed using amechanical dimpling process. An illustrative, non-exclusive example of amethod for forming first opening 304 is disclosed in U.S. Pat. No.6,256,882, the complete disclosure of which is hereby incorporated byreference. Applying the first layer of photoresist at 305, applying thesecond layer of photoresist at 320, forming the second opening at 310,and/or forming the third opening at 320 may be accomplished using anysuitable photolithographic technique, illustrative, non-exclusiveexamples of which include spin coating, patterning, exposing, and/ordeveloping.

First conductive material 317 may include any suitable conductivematerial, illustrative, non-exclusive examples of which include anysuitable metal and/or a rhodium nickel alloy. Similarly, secondconductive material 327 may include any suitable conductive material,illustrative, non-exclusive examples of which include any suitablemetal, copper, nickel, gold, and/or alloys thereof. Polishing the firstconductive material at 320 and/or the second conductive material at 330may include the use of any suitable method and/or technique to polish,smooth, decrease a thickness of and/or increase a uniformity of thefirst conductive material and/or the second conductive material. As anillustrative, non-exclusive example, the polishing may include chemicalmechanical polishing (CMP).

Elastomeric layer 347 may include any suitable elastomer, illustrative,non-exclusive examples of which are discussed in more detail herein.Forming the elastomeric layer on the carrier surface at 345 may includethe use of any suitable system and/or method to form the elastomericlayer, illustrative, non-exclusive examples of which include casting,applying, and/or spin-coating. It is within the scope of the presentdisclosure that forming the elastomeric layer also may include curingthe elastomeric layer. In addition, pressing the elastomeric layer intocontact with substrate 302 and rocking beam electrical conduit 42 at 345may include embedding the rocking beam electrical conduit into theelastomeric layer such that beam contact 48 contacts carrier surface 348and/or forming an adhesive bond between rocking beam electrical conduit42 and elastomeric layer 347.

Forming the elastomeric layer on substrate 302 at 349 may include theuse of any suitable method to form the elastomeric layer, illustrative,non-exclusive examples of which are discussed in more detail herein. Inaddition, pressing the carrier surface into contact with the elastomericlayer may include contacting beam contact 48 with carrier surface 348.It is within the scope of the present disclosure that the elastomericlayer may be cured subsequent to pressing the carrier surface intocontact with the elastomeric layer at 349 and that curing theelastomeric layer may include forming an adhesive bond between theelastomeric layer and the rocking beam electrical conduit.

Carrier surface 348 may include any suitable surface and/or material,illustrative, non-exclusive examples of which are discussed in moredetail herein with reference to substrate 302. In addition, carriersurface 348 may include any suitable surface roughness, including a rootmean square surface roughness of less than 10, less than 8, less than 6,less than 4, less than 2, less than 1, or less than 0.5 nanometers.

The pressing at 345 and/or 349 may include pressing with any suitableforce and/or pressure. As an illustrative, non-exclusive example, thepressing may include pressing with a pressure of at least 10, at least12, at least 14, at least 16, at least 18, or at least 20 megapascals.

Removing the substrate and the carrier surface from the electricalinterposer at 355 may include the use of any suitable process and/ormethod. As illustrative, non-exclusive examples, the removing mayinclude etching and/or dissolving the carrier surface and/or thesubstrate.

FIG. 16 is a flowchart depicting methods 400 according to the presentdisclosure of improving a dimensional stability of an electricalinterposer that includes a resilient dielectric body by stretching theelectrical interposer and/or the resilient dielectric body thereof. Asdiscussed in more detail herein, methods 400 may include supplying anelectrical interposer in an undeformed state, or configuration, at 410,stretching the electrical interposer to a deformed, or stretched, state,or configuration, at 420, applying the stretched electrical interposerto a space transformer at 430, and/or retaining the stretched electricalinterposer in the stretched configuration at 440.

Supplying the electrical interposer at 410 may include supplying anysuitable electrical interposer that includes a resilient dielectricbody, illustrative, non-exclusive examples of which are discussed inmore detail herein. Stretching the electrical interposer at 420 mayinclude the use of any suitable structure and/or method to stretch theelectrical interposer to the deformed state. Applying the stretchedelectrical interposer at 430 may include aligning a plurality ofelectrical conduits that are associated with the stretched electricalinterposer with a plurality of contact pads that may be present on thespace transformer and establishing electrical communication between theplurality of electrical conduits and the plurality of contact pads.Retaining the stretched electrical interposer in the stretchedconfiguration at 440 may include the use of any suitable structureand/or method to retain and/or maintain the stretched electricalinterposer in the stretched configuration. As an illustrative,non-exclusive example, the retaining may include adhering the stretchedelectrical interposer to the space transformer. As another illustrative,non-exclusive example, the retaining may include the use of any suitableretention structure, such as a frame.

FIG. 17 is a flowchart depicting methods 500 according to the presentdisclosure of increasing a vertical compliance of a device under testcontacting assembly by stacking a plurality of electrical interposers toform a layered interposer. Methods 500 may include providing a firstelectrical interposer at 510 and providing a second electricalinterposer at 520. The methods further may include aligning the firstelectrical interposer with the second electrical interposer at 530 andattaching the first electrical interposer to the second electricalinterposer to form the layered interposer at 540. In addition, themethods optionally may include applying the layered interposer to aspace transformer assembly at 550 and/or maintaining a gap between thefirst electrical interposer and the second electrical interposer at 560.

Providing the first electrical interposer at 510 and/or the secondelectrical interposer at 520 may include providing any suitableresilient interposer that may include a resilient dielectric body with aplurality of electrical conduits contained therein, illustrative,non-exclusive examples of which are discussed in more detail herein.

Aligning the first electrical interposer with the second electricalinterposer at 530 may include forming a plurality of electricalconnections between the plurality of electrical conduits of the firstelectrical interposer and the plurality of electrical conduits of thesecond electrical interposer. Attaching the first electrical interposerto the second electrical interposer at 540 may include the use of anysuitable system and/or method to operatively attach the first electricalinterposer to the second electrical interposer. As an illustrative,non-exclusive example, the attaching may include adhering the firstelectrical interposer to the second electrical interposer.

Applying the layered electrical interposer to the space transformerassembly at 550 may include operatively attaching the layered electricalinterposer to the space transformer assembly. Illustrative,non-exclusive examples of systems and/or methods that may be utilized tooperatively attach the layered electrical interposer to the spacetransformer are discussed in more detail herein. It is within the scopeof the present disclosure that the interposer may form a portion of aprobe head assembly that may be used in a test system and that themethods also may include probing, testing, and/or establishingelectrical communication with a device under test.

Maintaining the gap at 560 may include the use of any suitable structureand/or method to maintain the gap. As an illustrative, non-exclusiveexample, the maintaining may include maintaining the gap between a firstresilient dielectric body that is associated with the first electricalinterposer and a second resilient dielectric body that is associatedwith the second electrical interposer. As an illustrative, non-exclusiveexample, this may include utilizing any suitable spacer and/or resilientmaterial to maintain the gap.

In the present disclosure, several of the illustrative, non-exclusiveexamples have been discussed and/or presented in the context of flowdiagrams, or flow charts, in which the methods are shown and describedas a series of blocks, or steps. Unless specifically set forth in theaccompanying description, it is within the scope of the presentdisclosure that the order of the blocks may vary from the illustratedorder in the flow diagram, including with two or more of the blocks (orsteps) occurring in a different order and/or concurrently. It is alsowithin the scope of the present disclosure that the blocks, or steps,may be implemented as logic, which also may be described as implementingthe blocks, or steps, as logics. In some applications, the blocks, orsteps, may represent expressions and/or actions to be performed byfunctionally equivalent circuits or other logic devices. The illustratedblocks may, but are not required to, represent executable instructionsthat cause a computer, processor, and/or other logic device to respond,to perform an action, to change states, to generate an output ordisplay, and/or to make decisions.

As used herein, the term “and/or” placed between a first entity and asecond entity means one of (1) the first entity, (2) the second entity,and (3) the first entity and the second entity. Multiple entities listedwith “and/or” should be construed in the same manner, i.e., “one ormore” of the entities so conjoined. Other entities may optionally bepresent other than the entities specifically identified by the “and/or”clause, whether related or unrelated to those entities specificallyidentified. Thus, as a non-limiting example, a reference to “A and/orB,” when used in conjunction with open-ended language such as“comprising” may refer, in one embodiment, to A only (optionallyincluding entities other than B); in another embodiment, to B only(optionally including entities other than A); in yet another embodiment,to both A and B (optionally including other entities). These entitiesmay refer to elements, actions, structures, steps, operations, values,and the like.

As used herein, the phrase “at least one,” in reference to a list of oneor more entities should be understood to mean at least one entityselected from any one or more of the entity in the list of entities, butnot necessarily including at least one of each and every entityspecifically listed within the list of entities and not excluding anycombinations of entities in the list of entities. This definition alsoallows that entities may optionally be present other than the entitiesspecifically identified within the list of entities to which the phrase“at least one” refers, whether related or unrelated to those entitiesspecifically identified. Thus, as a non-limiting example, “at least oneof A and B” (or, equivalently, “at least one of A or B,” or,equivalently “at least one of A and/or B”) may refer, in one embodiment,to at least one, optionally including more than one, A, with no Bpresent (and optionally including entities other than B); in anotherembodiment, to at least one, optionally including more than one, B, withno A present (and optionally including entities other than A); in yetanother embodiment, to at least one, optionally including more than one,A, and at least one, optionally including more than one, B (andoptionally including other entities). In other words, the phrases “atleast one,” “one or more,” and “and/or” are open-ended expressions thatare both conjunctive and disjunctive in operation. For example, each ofthe expressions “at least one of A, B and C,” “at least one of A, B, orC,” “one or more of A, B, and C,” “one or more of A, B, or C” and “A, B,and/or C” may mean A alone, B alone, C alone, A and B together, A and Ctogether, B and C together, A, B and C together, and optionally any ofthe above in combination with at least one other entity.

In the event that any patents, patent applications, or other referencesare incorporated by reference herein and define a term in a manner orare otherwise inconsistent with either the non-incorporated portion ofthe present disclosure or with any of the other incorporated references,the non-incorporated portion of the present disclosure shall control,and the term or incorporated disclosure therein shall only control withrespect to the reference in which the term is defined and/or theincorporated disclosure was originally present.

As used herein the terms “adapted” and “configured” mean that theelement, component, or other subject matter is designed and/or intendedto perform a given function. Thus, the use of the terms “adapted” and“configured” should not be construed to mean that a given element,component, or other subject matter is simply “capable of” performing agiven function but that the element, component, and/or other subjectmatter is specifically selected, created, implemented, utilized,programmed, and/or designed for the purpose of performing the function.It is also within the scope of the present disclosure that elements,components, and/or other recited subject matter that is recited as beingadapted to perform a particular function may additionally oralternatively be described as being configured to perform that function,and vice versa.

Illustrative, non-exclusive examples of systems and methods according tothe present disclosure are presented in the following enumeratedparagraphs. It is within the scope of the present disclosure that anindividual step of a method recited herein, including in the followingenumerated paragraphs, may additionally or alternatively be referred toas a “step for” performing the recited action.

A1. An electrical interposer, comprising:

a resilient dielectric body, wherein the resilient dielectric bodyincludes a first surface and an opposed second surface; and

a plurality of electrical conduits located within the resilientdielectric body and configured to provide a plurality of electricalconnections between a first device that is proximal to the first surfaceand a second device that is proximal to the second surface, wherein eachof the plurality of electrical conduits is configured to deflect uponapplication of a contact force by at least one of the first device andthe second device, and further wherein at least a portion of a restoringforce for the plurality of electrical conduits is provided by theresilient dielectric body.

A2. The electrical interposer of paragraph A1, wherein the electricalinterposer further includes a means for modifying the restoring force ofthe plurality of electrical conduits, optionally wherein the means formodifying the restoring force includes a means for increasing therestoring force, and further optionally wherein the means for modifyingthe restoring force includes a means for decreasing the restoring force.

A3. The electrical interposer of paragraph A2, wherein the means formodifying the restoring force is associated with the resilientdielectric body.

A4. The electrical interposer of any of paragraphs A2-A3, wherein themeans for modifying the restoring force is associated with the pluralityof electrical conduits.

A5. The electrical interposer of any of paragraphs A1-A4, wherein theelectrical interposer further includes a plurality of compliancemodifying structures, wherein the plurality of compliance modifyingstructures are configured to change the restoring force provided to theplurality of electrical conduits, optionally wherein the plurality ofcompliance modifying structures is configured to increase the restoringforce that is provided to the plurality of electrical conduits, andfurther optionally wherein the plurality of compliance modifyingstructures is configured to decrease the restoring force that isprovided to the plurality of electrical conduits.

A6. The electrical interposer of paragraph A5, wherein the plurality ofcompliance modifying structures is associated with the resilientdielectric body.

A7. The electrical interposer of any of paragraphs A5-A6, wherein theplurality of compliance modifying structures includes a plurality ofcompliance modifying regions that include a different composition than aremainder of the resilient dielectric body.

A8. The electrical interposer of paragraph A7, wherein the plurality ofcompliance modifying regions includes at least one of a differentchemical composition, a different density, a different viscoelasticity,a different Young's modulus, and a different yield strain than theremainder of the resilient dielectric body.

A9. The electrical interposer of any of paragraphs A7-A8, wherein theplurality of compliance modifying regions includes at least one of aplurality of voids, a plurality of domains with a different compositionthan that of the resilient dielectric body, and a plurality of foamdomains within the resilient dielectric body.

A10. The electrical interposer of any of paragraphs A7-A9, wherein theplurality of compliance modifying regions at least one of is notuniformly distributed within the resilient dielectric body, is notuniform in a direction that is parallel to at least one of the firstsurface and the second surface, is systematically distributed within theresilient dielectric body, separates at least a portion of the pluralityof electrical conduits from the resilient dielectric body, extendsbetween the first surface and the second surface, and extends in adirection that is at least substantially perpendicular to at least one,and optionally both, of the first surface and the second surface.

A11. The electrical interposer of any of paragraphs A7-A10, wherein theplurality of compliance modifying regions is at least one of locatedproximal to and in mechanical communication with the plurality ofelectrical conduits.

A12. The electrical interposer of any of paragraphs A1-A11, wherein theplurality of electrical conduits includes a plurality of rocking beamelectrical conduits, wherein the plurality of rocking beam electricalconduits includes a beam structure, wherein the beam structure is atleast substantially parallel to at least one of the first surface andthe second surface when the resilient dielectric body is in anundeformed configuration, wherein a first end of the beam structureincludes a probe tip that extends from the beam structure and isconfigured to electrically contact the first device, and further whereinan opposed second end of the beam structure includes a beam contact thatis configured to electrically contact the second device.

A13. The electrical interposer of paragraph A12 when dependent from anyof paragraphs A7-A11, wherein the plurality of compliance modifyingregions is at least one of associated with, proximal to, and inmechanical communication with the beam structure, optionally wherein theplurality of compliance modifying regions is configured to at least oneof change, decrease, and increase the restoring force for the pluralityof electrical conduits, and further optionally wherein the plurality ofcompliance modifying regions is at least one of associated with,proximal to, and in mechanical communication with at least one of thefirst end of the beam structure and the second end of the beamstructure.

A14. The electrical interposer of any of paragraphs A12-A13, wherein theprobe tip extends from the beam structure in a first direction, andfurther wherein the beam contact extends from the beam structure in asecond direction that is generally opposed to the first direction,optionally wherein the probe tip extends past the first surface of theresilient dielectric body, and further optionally wherein the beamcontact extends at least flush with the second surface of the resilientdielectric body.

A15. The electrical interposer of paragraph A14 when dependent from anyof paragraphs A7-A11, wherein the plurality of compliance modifyingregions is at least one of associated with, proximal to, and inmechanical communication with the beam contact, and optionally whereinthe plurality of compliance modifying regions is configured to at leastone of change, decrease, and increase a scrubbing motion of the probetip when the probe tip contacts the first device.

A16. The electrical interposer of any of paragraphs A12-A15, wherein theplurality of rocking beam electrical conduits includes at least one ofrigid rocking beam electrical conduits, substantially rigid rocking beamelectrical conduits, flexible rocking beam electrical conduits,monolithic rocking beam electrical conduits, and composite rocking beamelectrical conduits, optionally wherein the beam structure includes atleast one of a rigid beam structure, a substantially rigid beamstructure, and a flexible beam structure, and further optionally whereinthe beam contact includes at least one of a rigid beam contact, asubstantially rigid beam contact, and a flexible beam contact.

A17. The electrical interposer of any of paragraphs A12-A16 whendependent from any of paragraphs A5-A11, wherein the plurality ofcompliance modifying structures includes a beam extension that extendspast the probe tip.

A18. The electrical interposer of any of paragraphs A12-A17 whendependent from any of paragraphs A5-A11, wherein the plurality ofcompliance modifying structures includes a non-rectangular beam shape.

A19. The electrical interposer of any of paragraphs A13-A18 whendependent from any of paragraphs A5-A11, wherein the plurality ofcompliance modifying structures includes a non-circular beam contactcross-section that is configured to increase a distance between acentral axis of the beam contact and a central axis of the probe tip fora given beam length.

A20. The electrical interposer of any of paragraphs A1-A19, wherein theelectrical interposer further includes a means for decreasing a planarexpansion of the electrical interposer when the electrical interposer iscompressed between the first device and the second device.

A21. The electrical interposer of paragraph A20, wherein the means fordecreasing the planar expansion of the electrical interposer includes aplurality of expansion pockets configured to decrease the planarexpansion of the electrical interposer when the electrical interposer iscompressed between the first device and the second device.

A22. The electrical interposer of paragraph A21, wherein the pluralityof expansion pockets is located between at least a portion of theplurality of electrical conduits.

A23. The electrical interposer of any of paragraphs A21-A22, wherein thefirst device includes a plurality of first contact pads configured toform an electrical connection with the plurality of electrical conduits,wherein the second device includes a plurality of second contact padsconfigured to form an electrical connection with the plurality ofelectrical conduits, and further wherein the plurality of expansionpockets is configured to provide for compression of the electricalinterposer in a region between the plurality of electrical conduitswithout substantial motion of the plurality of electrical conduits withrespect to the plurality of first contact pads and the plurality ofsecond contact pads.

A24. The electrical interposer of any of paragraphs A21-A23, wherein theplurality of expansion pockets extends from the first surface to thesecond surface.

A25. The electrical interposer of any of paragraphs A21-A24, wherein theplurality of expansion pockets includes a substantially cylindricalshape.

A26. The electrical interposer of any of paragraphs A21-A25, wherein theplurality of expansion pockets includes at least one of a differentchemical composition, a different density, a different viscoelasticity,a different Young's modulus, and a different yield strain than aremainder of the resilient dielectric body.

A27. The electrical interposer of any of paragraphs A21-A26, wherein theplurality of expansion pockets includes at least one of a plurality ofvoids, a plurality of domains with a different composition than that ofthe resilient dielectric body, and a plurality of foam domains withinthe resilient dielectric body.

A28. The electrical interposer of any of paragraphs A21-A27, wherein theplurality of expansion pockets is at least one of not uniformlydistributed within the resilient dielectric body, not uniform in adirection that is parallel to at least one of the first surface and thesecond surface, and systematically distributed within the resilientdielectric body.

A29. The electrical interposer of any of paragraphs A20-A28, wherein themeans for decreasing the planar expansion of the electrical interposerincludes a stretched electrical interposer that is formed at a firstsize and stretched to a second size that is larger than the first sizeprior to being compressed between the first device and the second deviceto decrease planar expansion of the electrical interposer.

A30. The electrical interposer of any of paragraphs A1-A29, wherein eachof the plurality of electrical conduits includes a/the probe tip that isconfigured to electrically contact the first device, and further whereinthe probe tip includes at least one of a rounded profile, ahemispherical profile, and an inverse convolute profile that isconfigured to decrease abrasion of the first device when the probe tipcontacts the first device.

A31. The electrical interposer of any of paragraphs A1-A30, wherein eachof the plurality of electrical conduits includes a/the probe tip that isconfigured to electrically contact a respective contact pad on the firstdevice, and further wherein a characteristic dimension of the probe tipis larger than a characteristic dimension of the respective contact pad,optionally wherein the characteristic dimension of the probe tipincludes at least one of a diameter of the probe tip and an effectivediameter of the probe tip, and further optionally wherein thecharacteristic dimension of the contact pad includes a length of thecontact pad.

A32. The electrical interposer of any of paragraphs A1-A31, wherein theresilient dielectric body includes a plurality of substantially planardielectric layers.

A33. The electrical interposer of paragraph A32, wherein the resilientdielectric body includes an elastomeric layer and a dimensionalstability layer that is configured to maintain the plurality ofelectrical conduits in a substantially fixed relative orientation withina plane of the resilient dielectric body.

A34. The electrical interposer of paragraph A33, wherein the dimensionalstability layer includes a polyimide layer.

A35. The electrical interposer of any of paragraphs A33-A34, wherein thedimensional stability layer is present on the first surface of theresilient dielectric body, further wherein a/the probe tip associatedwith each the plurality of electrical conduits extends through thedimensional stability layer, and optionally wherein a remainder of eachof the plurality of electrical conduits does not extend through thedimensional stability layer.

A36. The electrical interposer of any of paragraphs A33-A34, wherein thedimensional stability layer is present on the second surface of theresilient dielectric body.

A37. The electrical interposer of any of paragraphs A33-A36, wherein theelastomeric layer is a first elastomeric layer, and further wherein thedimensional stability layer is located between the first elastomericlayer and a second elastomeric layer.

A38. The electrical interposer of any of paragraphs A1-A37, wherein theresilient dielectric body is fabricated on a material with a lowcoefficient of thermal expansion, optionally wherein the resilientdielectric body is removed from the material with a low coefficient ofthermal expansion prior to use of the electrical interposer, and furtheroptionally wherein the material with a low coefficient of thermalexpansion includes silicon.

A39. The electrical interposer of any of paragraphs A1-A38, wherein atleast 2 of the plurality of electrical conduits are configured toprovide electrical connections with a single contact pad on the firstdevice, and optionally wherein at least 3, at least 4, at least 5, atleast 10, 2-5, or 2-10 of the plurality of electrical conduits areconfigured to provide electrical connections with a single contact padon the first device.

A40. The electrical interposer of any of paragraphs A1-A39, wherein theelectrical interposer includes the second device, wherein the electricalinterposer is operatively attached to the second device, and furtherwherein the second device includes a locating structure configured tomechanically couple with the plurality of electrical conduits to controlan alignment of the plurality of electrical conduits with respect to thesecond device, and optionally wherein the locating structure includes atleast one of a post and a detent.

A41. The electrical interposer of any of paragraphs A1-A40, wherein theelectrical interposer includes a cover that is configured to protect theelectrical interposer when the electrical interposer is not inelectrical communication with the first device, and optionally whereinthe cover includes a plurality of recesses that are located tocorrespond to the plurality of electrical conduits.

A42. The electrical interposer of any of paragraphs A1-A41, wherein theplurality of electrical conduits is configured to be at least one ofremoved from the electrical interposer, reinserted into the electricalinterposer, and selectively replaced without damage to the electricalinterposer or the plurality of electrical conduits.

A43. The electrical interposer of any of paragraphs A1-A42, wherein theelectrical interposer further includes a plurality of contactstructures, wherein each of the plurality of contact structures isassociated with a respective one of the plurality of electricalconduits, wherein the plurality of contact structures is located betweenthe plurality of electrical conduits and the first device, and furtherwherein the plurality of contact structures is configured to decreaseabrasion of a surface of the first device when forming the electricalcommunication between the first device and the electrical interposer.

A44. The electrical interposer of any of paragraphs A1-A43, wherein theresilient dielectric body includes at least one of an elastomer andsilicone, and optionally wherein the resilient dielectric body furtherincludes at least one of a foam and a closed-cell foam.

A45. The electrical interposer of any of paragraphs A1-A44, wherein atleast one of the first device and the second device includes at leastone of a space transformer, an electronic device, an electricalinterposer, a device under test, an integrated circuit, a socket, a tierof a three-dimensional integrated circuit, a probe head, a portion of aprobe head, a test system, and a portion of a test system, andoptionally wherein the electrical interposer includes at least one, andoptionally both, of the first device and the second device.

B1. A layered interposer including a first outer surface and an opposedsecond outer surface, the layered interposer comprising:

a first electrical interposer, wherein the first electrical interposerincludes the electrical interposer of any of paragraphs A1-A45; and

a second electrical interposer, wherein the second electrical interposerincludes the electrical interposer of any of paragraphs A1-A45, whereina first surface of the first electrical interposer forms the first outersurface of the layered interposer, wherein a second surface of the firstelectrical interposer is proximal to and in electrical communicationwith a first surface of the second electrical interposer, wherein asecond surface of the second electrical interposer forms the secondouter surface of the layered interposer, and further wherein at least aportion of the plurality of electrical conduits of the first electricalinterposer is in electrical communication with a respective portion ofthe plurality of electrical conduits of the second electrical interposerand configured to provide the plurality of electrical connectionsbetween the first outer surface and the second outer surface.

B2. The layered interposer of paragraph B1, wherein the layeredinterposer further includes at least a first intermediate interposerbetween the first interposer and the second interposer, optionallywherein the layered interposer includes 1, 2, 3, 4, 5, or more than 5intermediate interposers between the first interposer and the secondinterposer.

B3. The layered interposer of any of paragraphs B1-B2, wherein thelayered interposer further includes a gap between the resilientdielectric body of the first electrical interposer and the resilientdielectric body of the second electrical interposer, and optionallywherein the gap includes at least one of an air gap and a filled gapthat includes a dielectric material that is configured to be compressedbetween the resilient dielectric body of the first electrical interposerand the resilient dielectric body of the second electrical interposer.

B4. The layered interposer of any of paragraphs B1-B3, wherein thelayered interposer is configured to be compressed between a firstelectrical device and a second electrical device, and further wherein acompression distance of the layered electrical interposer is at least 10micrometers, optionally including compression distances of at least 20,at least 30, at least 40, at least 50, at least 60, at least 70, atleast 80, at least 90, at least 100, at least 125, at least 150, atleast 200, or at least 250 micrometers.

C1. A membrane configured to provide an electrical connection between adevice under test and a probe head, the membrane comprising:

the electrical interposer of any of paragraphs A1-A45 or the layeredinterposer of any of paragraphs B1-B4.

D1. A coupon configured to provide an electrical connection between adevice under test and a probe head assembly, the coupon comprising:

the electrical interposer of any of paragraphs A1-A45, the layeredinterposer of any of paragraphs B1-B4, or the membrane of paragraph C1.

D2. The coupon of paragraph D1, wherein the first device includes aportion of a probe head assembly, and further wherein the coupon isadhesively bonded to the first device.

E1. A composite space transformer configured to provide a plurality ofelectrical connections between a first electrical device that includes aplurality of first contact pads spaced at a first pitch and a secondelectrical device that includes a plurality of second contact padsspaced at a second pitch, wherein the first pitch is greater than thesecond pitch, the composite space transformer comprising:

a first space transformer including a first space transformer uppersurface and a first space transformer lower surface;

an electrical interposer, wherein the electrical interposer includes theelectrical interposer of any of paragraphs A1-A45 or the layeredinterposer of any of paragraphs B1-B4, and further wherein the firstsurface of the electrical interposer is configured to electricallycontact the first space transformer lower surface; and

a second space transformer including a second space transformer uppersurface and a second space transformer lower surface, wherein the secondspace transformer upper surface is configured to electrically contactthe second surface of the first electrical interposer.

E2. The composite space transformer of paragraph E1, wherein the firstspace transformer upper surface includes a plurality of first spacetransformer upper surface electrical contacts that are spaced at thefirst pitch, wherein the first space transformer lower surface includesa plurality of first space transformer lower surface electrical contactsthat are spaced at an intermediate pitch that is between the first pitchand the second pitch, wherein the second space transformer upper surfaceincludes a plurality of second space transformer upper surfaceelectrical contacts that are spaced at the intermediate pitch, whereinthe second space transformer lower surface includes a plurality ofsecond space transformer lower surface electrical contacts that arespaced at the second pitch, and further wherein the electricalinterposer is configured to form an electrical connection between theplurality of first space transformer lower surface electrical contactsand the plurality of second space transformer upper surface electricalcontacts.

E3. The composite space transformer of any of paragraphs E1-E2, whereinthe electrical interposer is a first electrical interposer, and furtherwherein the composite space transformer further includes a secondelectrical interposer, wherein the second electrical interposer includesthe electrical interposer of any of paragraphs A1-A45 or the layeredinterposer of any of paragraphs B1-B4, and further wherein the firstsurface of the second electrical interposer is configured toelectrically contact the second space transformer lower surface.

F1. A probe head assembly for electrically contacting a device undertest comprising:

a signal conduit that is configured to at least one of provide a testsignal to and receive a resultant signal from the device under test;

a space transformer in electrical communication with the signal conduit;and

a probe head, wherein the probe head includes the electrical interposerof any of paragraphs A1-A45, the layered interposer of any of paragraphsB1-B4, the membrane of paragraph C1, the coupon of any of paragraphsD1-D2, or the composite space transformer of any of paragraphs E1-E3,wherein a first surface of the probe head is configured to form anelectrical connection with the space transformer, and further wherein asecond surface of the probe head is configured to form an electricalconnection with the device under test.

G1. A test system comprising:

the probe head of paragraph F1;

a signal generator configured to generate the test signal; and

a signal analyzer configured to analyze the resultant signal.

H1. A packaged electronic device comprising:

an integrated circuit device;

a socket; and

an interconnect structure configured to provide a plurality ofelectrical connections between the integrated circuit device and thesocket, wherein the interconnect structure includes the electricalinterposer of any of paragraphs A1-A45, the layered interposer of any ofparagraphs B1-B4, the membrane of paragraph C1, the coupon of any ofparagraphs D1-D2, or the composite space transformer of any ofparagraphs E1-E3.

H2. The packaged electronic device of paragraph H1, wherein theinterconnect structure is configured to be adhesively bonded to at leastone, and optionally both, of the integrated circuit device and thesocket.

H3. The packaged electronic device of any of paragraphs H1-H2, whereinthe interconnect structure is configured to provide for separation ofthe integrated circuit device from the socket without damage to at leastone, optionally two, and further optionally all three of the integratedcircuit device, the interconnect structure, and the socket.

I1. A three-dimensional integrated circuit comprising:

a first integrated circuit device;

a second integrated circuit device; and

an interconnect structure configured to provide a plurality ofelectrical connections between the first integrated circuit device andthe second integrated circuit device, wherein the interconnect structureincludes the electrical interposer of any of paragraphs A1-A45, thelayered interposer of any of paragraphs B1-B4, the membrane of paragraphC1, the coupon of any of paragraphs D1-D2, or the composite spacetransformer of any of paragraphs E1-E3.

I2. The three-dimensional integrated circuit of paragraph I1, whereinthe interconnect structure is configured to be adhesively bonded to atleast one, and optionally both, of the first integrated circuit deviceand the second integrated circuit device.

I3. The three-dimensional integrated circuit of any of paragraphs I1-I2,wherein the interconnect structure is configured to provide forseparation of the first integrated circuit device from the secondintegrated circuit device without damage to at least one, optionallytwo, and further optionally all three, of the first integrated circuitdevice, the second integrated circuit device, and the interconnectstructure.

J1. A method of forming an electrical interposer including a resilientdielectric body that includes an elastomeric layer, the methodcomprising:

forming a plurality of interposer conduits on a surface of a substrate;

forming the elastomeric layer on a carrier surface, wherein theelastomeric layer includes an exposed surface;

pressing the exposed surface of the elastomeric layer into contact withthe surface of the substrate;

embedding the plurality of interposer conduits in the elastomeric layer,wherein the embedding includes mechanically contacting at least aportion of each of the plurality of interposer conduits with the carriersurface;

separating the carrier surface from the elastomeric layer; and

separating the surface of the substrate from the elastomeric layer whileleaving the plurality of interposer conduits embedded within theelastomeric layer.

J2. The method of paragraph J1, wherein, prior to the pressing, themethod includes applying an adhesive layer to at least one, optionallyat least two, and further optionally all three of the surface of thesubstrate, the plurality of interposer conduits, and the exposed surfaceof the elastomeric layer.

J3. The method of any of paragraphs J1-J2, wherein forming theelastomeric layer includes curing the elastomeric layer, optionallywherein the curing includes curing the elastomeric layer prior to thepressing, and further optionally wherein forming the elastomeric layerincludes at least one of applying the elastomeric layer to the carriersurface and casting the elastomeric layer on the carrier surface.

J4. The method of any of paragraphs J143, wherein the embedding includesforming an adhesive bond between the plurality of interposer conduitsand the elastomeric layer.

K1. A method of forming an electrical interposer including a resilientdielectric body that includes an elastomeric layer, the methodcomprising:

forming a plurality of interposer conduits on a surface of a substrate;

applying the elastomeric layer to the surface of the substrate, whereinthe applying includes covering the plurality of interposer conduits withthe elastomeric layer, and further wherein the elastomeric layerincludes an exposed surface;

pressing a carrier surface onto the exposed surface, wherein thepressing includes mechanically contacting the carrier surface with atleast a portion of each of the plurality of interposer conduits;

curing the elastomeric layer;

separating the carrier surface from the elastomeric layer; and

separating the surface of the substrate from the elastomeric layer whileleaving the plurality of interposer conduits embedded within theelastomeric layer.

K2. The method of paragraph K1, wherein, prior to applying theelastomeric layer, the method includes applying an adhesive layer to atleast one, and optionally both, of the surface of the substrate and theplurality of interposer conduits.

K3. The method of any of paragraphs K1-K2, wherein curing theelastomeric layer includes forming an adhesive bond between theplurality of interposer conduits and the elastomeric layer.

L1. The method of any of paragraphs J1-K3, wherein the pressing includespressing with a pressing force of at least 10 megapascals, optionallyincluding a pressing force of at least 12, at least 14, at least 16, atleast 18, or at least 20 megapascals.

L2. The method of any of paragraphs J1-L1, wherein forming the pluralityof interposer conduits includes performing at least one of a depositionprocess, a lithography process, an etch process, and a mechanicaldimpling process.

L3. The method of any of paragraphs J1-L2, wherein at least one ofseparating the carrier surface from the elastomeric layer and separatingthe surface of the substrate from the elastomeric layer includes atleast one of etching and dissolving at least one of the carrier surfaceand the substrate.

L4. The method of any of paragraphs J1-L3, wherein the plurality ofinterposer conduits includes a plurality of rocking beam electricalconduits, wherein the plurality of rocking beam electrical conduitsincludes a plurality of beam structures, wherein a first end of each ofthe plurality of beam structures includes a tip that extends from thebeam structure and is configured to contact a device under test, andfurther wherein an opposed second end of each of the plurality of beamstructures includes a beam contact that extends from the beam structure.

L5. The method of any of paragraphs J1-L4, wherein the method furtherincludes forming a dimensional stability layer at least one of withinthe electrical interposer and on a surface of the electrical interposer,wherein the dimensional stability layer is configured to maintain arelative orientation of the plurality of interposer conduits, optionallywherein the dimensional stability layer includes a polyimide layer, andfurther optionally wherein forming the dimensional stability layerincludes at least one of forming the dimensional stability layer priorto the separating and forming the dimensional stability layer subsequentto the separating.

L6. The method of any of paragraphs J1-L5, wherein the substrateincludes at least one of a crystalline substrate, a semiconductorsubstrate, a silicon substrate, a glass substrate, a metallic substrate,and a copper substrate.

L7. The method of any of paragraphs J1-L6, wherein the carrier surfaceincludes a root mean square roughness of less than 10 nanometers,optionally including a root mean square roughness of less than 8, lessthan 6, less than 4, less than 2, less than 1, or less than 0.5nanometers.

M1. The electrical interposer of any of paragraphs A1-A45, the layeredinterposer of any of paragraphs B1-84, the membrane of paragraph C1, orthe coupon of any of paragraphs D1-D2 formed using the method of any ofparagraphs J1-L7.

N1. A method of controlling a restoring force that is applied to a probetip by a resilient dielectric body when the probe tip is deflected froman initial orientation to a deflected orientation through contact with adevice under test, wherein the probe tip is embedded in the resilientdielectric body, and further wherein the probe tip is configured to forman electrical connection with the device under test, the methodcomprising:

forming a compliance modifying region within the resilient dielectricbody.

N2. The method of paragraph N1, wherein the compliance modifying regionincludes at least one of a void, a domain with a different compositionthan that of the resilient dielectric body, and a foam domain.

N3. The method of any of paragraphs N1-N2, wherein the compliancemodifying region includes at least one of a different chemicalcomposition, a different density, a different viscoelasticity, adifferent Young's modulus, and a different yield strain than a remainderof the resilient dielectric body.

N4. The method of any of paragraphs N1-N3, wherein the compliancemodifying region is in mechanical communication with the probe tip.

N5. The method of any of paragraphs N1-N4, wherein the resilientdielectric body includes the resilient dielectric body of the electricalinterposer of any of paragraphs A1-A45, the layered interposer of any ofparagraphs B1-B4, the membrane of paragraph C1, or the coupon of any ofparagraphs D1-D2.

O1. A method of increasing a dimensional stability of a plurality ofelectrical conduits that are contained within a resilient dielectricbody, wherein the resilient dielectric body includes a first surface andan opposed second surface, wherein each of the plurality of electricalconduits extends from the first surface to the second surface, andfurther wherein the plurality of electrical conduits is configured toform a plurality of electrical connections with a device under test, themethod comprising:

supplying the resilient dielectric body in an undeformed configuration;

stretching the resilient dielectric body to a stretched configuration;and

applying the resilient dielectric body to a space transformer, whereinthe applying includes maintaining the resilient dielectric body in thestretched configuration, and further wherein the applying includesaligning the plurality of electrical conduits with a plurality ofrespective contact pads on the space transformer.

O2. The method of paragraph O1, wherein the resilient dielectric bodyincludes the resilient dielectric body of the electrical interposer ofany of paragraphs A1-A45, the layered interposer of any of paragraphsB1-B4, the membrane of paragraph C1, or the coupon of any of paragraphsD1-D2.

P1. A method of increasing the vertical compliance of a device undertest contacting assembly that is configured to form a plurality ofelectrical connections between a probe head assembly and a device undertest, the method comprising:

providing a first electrical interposer, wherein the first electricalinterposer includes a first resilient dielectric body with a firstplurality of electrical conduits contained therein;

providing a second electrical interposer, wherein the second electricalinterposer includes a second resilient dielectric body with a secondplurality of electrical conduits contained therein;

aligning the first electrical interposer with the second electricalinterposer, wherein the aligning includes aiming a plurality ofelectrical connections between the first plurality of electricalconduits and the second plurality of electrical conduits; and

operatively attaching the first electrical interposer to the secondelectrical interposer to form a layered electrical interposer.

P2. The method of paragraph P1, wherein the method further includesapplying the layered electrical interposer to a space transformer of theprobe head assembly, and optionally wherein the applying includesadhering the layered electrical interposer to the space transformer ofthe probe head assembly.

P3. The method of any of paragraphs P1-P2, wherein the method furtherincludes maintaining a gap between the first resilient dielectric bodyand the second resilient dielectric body.

P4. The method of any of paragraphs P1-P3, wherein the operativelyattaching includes adhering the first electrical interposer to thesecond electrical interposer.

P5. The method of any of paragraphs P1-P4, wherein at least one, andoptionally both, of the first electrical interposer and the secondelectrical interposer includes the electrical interposer of any ofparagraphs A1-A45.

Q1. The use of the electrical interposer of any of paragraphs A1-A45,the layered interposer of any of paragraphs B1-B4, the membrane ofparagraph C1, the coupon of any of paragraphs D1-D2, the composite spacetransformer of any of paragraphs E1-E3, the probe head or probe headassembly of paragraph F1, the test system of paragraph G1, the packagedelectronic device of any of paragraphs H1-H3, or the three-dimensionalintegrated circuit of any of paragraphs I1-I3 with the method of any ofparagraphs J1-L7 or N1-P5.

Q2. The use of the method of any of paragraphs J1-L7 to form theelectrical interposer of any of paragraphs A1-A45, the layeredinterposer of any of paragraphs B1-B4, the membrane of paragraph C1, thecoupon of any of paragraphs D1-D2, the composite space transformer ofany of paragraphs E1-E3, the probe head or probe head assembly ofparagraph F1, the test system of paragraph G1, the packaged electronicdevice of any of paragraphs H1-H3, or the three-dimensional integratedcircuit of any of paragraphs I1-I3.

Q3. The use of the method of any of paragraphs N1-N5 to control therestoring force that is applied to the probe tip by the resilientdielectric body of the electrical interposer of any of paragraphsA1-A45, the layered interposer of any of paragraphs B1-B4, the membraneof paragraph C1, the coupon of any of paragraphs D1-D2, the compositespace transformer of any of paragraphs E1-E3, the probe head or probehead assembly of paragraph F1, the test system of paragraph G1, thepackaged electronic device of any of paragraphs H1-H3, or thethree-dimensional integrated circuit of any of paragraphs I1-I3.

Q4. The use of the method of any of paragraphs O1-O2 to increase thedimensional stability of the electrical interposer of any of paragraphsA1-A45, the layered interposer of any of paragraphs B1-B4, the membraneof paragraph C1, the coupon of any of paragraphs D1-D2, the compositespace transformer of any of paragraphs E1-E3, the probe head or probehead assembly of paragraph F1, the test system of paragraph G1, thepackaged electronic device of any of paragraphs H1-H3, or thethree-dimensional integrated circuit of any of paragraphs I1-I3.

Q5. The use of the method of any of paragraphs P1-P5 to form the layeredinterposer of any of paragraphs B1-B4.

Q6. The use of a compliance modifying structure to change a restoringforce that is provided to an electrical conduit that is embedded in aresilient dielectric layer by the resilient dielectric layer.

Q7. The use of a plurality of expansion pockets to decrease a planarexpansion of a resilient electrical interposer that is compressedbetween a first device and a second device.

Q8. The use of a layered interposer to increase a vertical compliance ofa probe head assembly.

Q9. The use of an electrical interposer that includes a stretchedresilient dielectric body to increase a dimensional stability of theelectrical interposer when the electrical interposer is compressedbetween a first device and a second device.

INDUSTRIAL APPLICABILITY

The systems and methods disclosed herein are applicable to theelectronics industry.

It is believed that the disclosure set forth above encompasses multipledistinct inventions with independent utility. While each of theseinventions has been disclosed in its preferred form, the specificembodiments thereof as disclosed and illustrated herein are not to beconsidered in a limiting sense as numerous variations are possible. Thesubject matter of the inventions includes all novel and non-obviouscombinations and subcombinations of the various elements, features,functions and/or properties disclosed herein. Similarly, where theclaims recite “a” or “a first” element or the equivalent thereof, suchclaims should be understood to include incorporation of one or more suchelements, neither requiring nor excluding two or more such elements.

It is believed that the following claims particularly point out certaincombinations and subcombinations that are directed to one of thedisclosed inventions and are novel and non-obvious. Inventions embodiedin other combinations and subcombinations of features, functions,elements and/or properties may be claimed through amendment of thepresent claims or presentation of new claims in this or a relatedapplication. Such amended or new claims, whether they are directed to adifferent invention or directed to the same invention, whetherdifferent, broader, narrower, or equal in scope to the original claims,are also regarded as included within the subject matter of theinventions of the present disclosure.

1. A method of increasing a dimensional stability of a plurality ofelectrical conduits that are contained within a resilient dielectricbody of a probe head, wherein the resilient dielectric body includes afirst surface and an opposed second surface, wherein each of theplurality of electrical conduits extends from the first surface to theopposed second surface, and further wherein the plurality of electricalconduits is configured to form a plurality of electrical connectionswith a device under test during testing of the device under test withthe probe head, the method comprising: stretching the resilientdielectric body from a first configuration to a stretched configuration;applying the resilient dielectric body to a space transformer, whereinthe applying includes maintaining the resilient dielectric body in thestretched configuration, and further wherein the applying includesaligning the plurality of electrical conduits with a plurality ofrespective contact pads on the space transformer; and retaining theresilient dielectric body in the stretched configuration subsequent tothe applying by adhering the resilient dielectric body to the spacetransformer with an adhesive.
 2. The method of claim 1, wherein theretaining includes directly adhering the resilient dielectric body tothe space transformer with an adhesive.
 3. The method of claim 1,wherein the adhering includes adhering such that the adhesive does notcontact the plurality of electrical conduits and such that the adhesivedoes not contact the plurality of contact pads.
 4. The method of claim1, wherein the adhering includes adhering with a permanent adhesive. 5.The method of claim 1, wherein the adhering includes adhering with atemporary adhesive.
 6. The method of claim 1, wherein the stretchedconfiguration is larger than the first configuration in a plane of thefirst surface.
 7. The method of claim 1, wherein the applying furtherincludes establishing electrical communication between the plurality ofelectrical conduits and the plurality of respective contact pads.
 8. Themethod of claim 1, wherein, subsequent to the retaining, the methodfurther includes removing the resilient dielectric body from the spacetransformer.
 9. The method of claim 8, wherein the removing includesseparating the resilient dielectric body from the space transformerwithout damage to the space transformer.
 10. The method of claim 8,wherein the removing includes separating the resilient dielectric bodyfrom the space transformer without damage to the resilient dielectricbody.
 11. A probe head, comprising: a first device including a pluralityof contact pads; a coupon including a resilient dielectric body and aplurality of electrical conduits, wherein the resilient dielectric bodyincludes a first surface and an opposed second surface, wherein each ofthe plurality of electrical conduits extends from the first surface tothe opposed second surface, and further wherein the plurality ofelectrical conduits is configured to form a plurality of electricalconnections with a second device during testing of the second device bythe probe head; and wherein the coupon is operatively attached to thefirst device, and wherein the resilient dielectric body is maintained ina stretched configuration that is different from an undeformedconfiguration of the resilient dielectric body prior to operativeattachment of the coupon to the first device.
 12. The probe head ofclaim 11, wherein the first device includes a space transformer.
 13. Theprobe head of claim 11, wherein the coupon is operatively attached tothe first device with an adhesive.
 14. The probe head of claim 13,wherein the adhesive does not extend in contact with the plurality ofelectrical conduits, and further wherein the adhesive does not extend incontact with the plurality of contact pads.
 15. The probe head of claim13, wherein the adhesive is a permanent adhesive.
 16. The probe head ofclaim 13, wherein the adhesive is a temporary adhesive.
 17. The probehead of claim 16, wherein the temporary adhesive is configured to permitremoval of the coupon from the first device without damage to the firstdevice.
 18. The probe head of claim 11, wherein each of the plurality ofelectrical conduits is aligned with a corresponding one of the pluralityof contact pads and in electrical communication with the correspondingone of the plurality of contact pads.
 19. A test system for testing adevice under test, the test system comprising: the probe head of claim11; a signal generator configured to generate a test signal; and asignal analyzer configured to analyze a resultant signal.
 20. A probehead assembly for electrically contacting a device under test, the probehead assembly comprising: a signal conduit that is configured to atleast one of provide a test signal to and receive a resultant signalfrom the device under test; a space transformer in electricalcommunication with the signal conduit; and a probe head, wherein theprobe head includes: (i) a resilient dielectric body that includes afirst surface and an opposed second surface; and (ii) a plurality ofelectrical conduits located within the resilient dielectric body andconfigured to provide a plurality of electrical connections between thespace transformer and the device under test; wherein the probe headfurther includes a means for decreasing a planar expansion of the probehead when the probe head is compressed between the space transformer andthe device under test; and wherein the means for decreasing the planarexpansion of the probe head includes a stretched probe head that isformed at a first size and stretched to a second size that is largerthan the first size prior to being compressed between the spacetransformer and the device under test.